共 15 条
Over 1.5 μm light emission from InAs quantum dots embedded in InGaAs strain-reducing layer grown by metalorganic chemical vapor deposition
被引:258
作者:

Tatebayashi, J
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Tokyo, Adv Sci & Technol Res Ctr, Meguro Ku, Tokyo 1538505, Japan Univ Tokyo, Adv Sci & Technol Res Ctr, Meguro Ku, Tokyo 1538505, Japan

Nishioka, M
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Tokyo, Adv Sci & Technol Res Ctr, Meguro Ku, Tokyo 1538505, Japan Univ Tokyo, Adv Sci & Technol Res Ctr, Meguro Ku, Tokyo 1538505, Japan

Arakawa, Y
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Tokyo, Adv Sci & Technol Res Ctr, Meguro Ku, Tokyo 1538505, Japan Univ Tokyo, Adv Sci & Technol Res Ctr, Meguro Ku, Tokyo 1538505, Japan
机构:
[1] Univ Tokyo, Adv Sci & Technol Res Ctr, Meguro Ku, Tokyo 1538505, Japan
关键词:
D O I:
10.1063/1.1375842
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
We demonstrated the 1.52 mum light emission at room temperature from self-assembled InAs quantum dots embedded in the In0.45Ga0.55As strain-reducing layer. By capping InAs quantum dots with an InGaAs strain-reducing layer instead of GaAs, the photoluminescence peak of InAs quantum dots can be controlled by changing the indium composition of the InGaAs strain-reducing layer. The full width at half maximum is as narrow as 22 meV. The wavelength of 1.52 mum is the longest wavelength so far achieved in self-assembled InAs quantum dots, which would be promising to quantum-dot lasers on GaAs substrate for application to light sources in long-wavelength optical communication systems. (C) 2001 American Institute of Physics.
引用
收藏
页码:3469 / 3471
页数:3
相关论文
共 15 条
[1]
MULTIDIMENSIONAL QUANTUM WELL LASER AND TEMPERATURE-DEPENDENCE OF ITS THRESHOLD CURRENT
[J].
ARAKAWA, Y
;
SAKAKI, H
.
APPLIED PHYSICS LETTERS,
1982, 40 (11)
:939-941

ARAKAWA, Y
论文数: 0 引用数: 0
h-index: 0

SAKAKI, H
论文数: 0 引用数: 0
h-index: 0
[2]
Room-temperature operation of In0.4Ga0.6As/GaAs self-organised quantum dot lasers
[J].
Kamath, K
;
Bhattacharya, P
;
Sosnowski, T
;
Norris, T
;
Phillips, J
.
ELECTRONICS LETTERS,
1996, 32 (15)
:1374-1375

Kamath, K
论文数: 0 引用数: 0
h-index: 0
机构: Solid State Electronics Laboratory, Dept. of Elec. Eng. and Comp. Sci., University of Michigan, Ann Arbor

Bhattacharya, P
论文数: 0 引用数: 0
h-index: 0
机构: Solid State Electronics Laboratory, Dept. of Elec. Eng. and Comp. Sci., University of Michigan, Ann Arbor

Sosnowski, T
论文数: 0 引用数: 0
h-index: 0
机构: Solid State Electronics Laboratory, Dept. of Elec. Eng. and Comp. Sci., University of Michigan, Ann Arbor

Norris, T
论文数: 0 引用数: 0
h-index: 0
机构: Solid State Electronics Laboratory, Dept. of Elec. Eng. and Comp. Sci., University of Michigan, Ann Arbor

Phillips, J
论文数: 0 引用数: 0
h-index: 0
机构: Solid State Electronics Laboratory, Dept. of Elec. Eng. and Comp. Sci., University of Michigan, Ann Arbor
[3]
LOW-THRESHOLD, LARGE T-O INJECTION-LASER EMISSION FROM (INGA)AS QUANTUM DOTS
[J].
KIRSTAEDTER, N
;
LEDENTSOV, NN
;
GRUNDMANN, M
;
BIMBERG, D
;
USTINOV, VM
;
RUVIMOV, SS
;
MAXIMOV, MV
;
KOPEV, PS
;
ALFEROV, ZI
;
RICHTER, U
;
WERNER, P
;
GOSELE, U
;
HEYDENREICH, J
.
ELECTRONICS LETTERS,
1994, 30 (17)
:1416-1417

KIRSTAEDTER, N
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

LEDENTSOV, NN
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

GRUNDMANN, M
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

BIMBERG, D
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

USTINOV, VM
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

RUVIMOV, SS
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

MAXIMOV, MV
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

KOPEV, PS
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

ALFEROV, ZI
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

RICHTER, U
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

WERNER, P
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

GOSELE, U
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

HEYDENREICH, J
论文数: 0 引用数: 0
h-index: 0
机构: AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA
[4]
Extremely low room-temperature threshold current density diode lasers using InAs dots in In0.15Ga0.85As quantum well
[J].
Liu, GT
;
Stintz, A
;
Li, H
;
Malloy, KJ
;
Lester, LF
.
ELECTRONICS LETTERS,
1999, 35 (14)
:1163-1165

Liu, GT
论文数: 0 引用数: 0
h-index: 0
机构:
Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA

Stintz, A
论文数: 0 引用数: 0
h-index: 0
机构:
Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA

Li, H
论文数: 0 引用数: 0
h-index: 0
机构:
Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA

Malloy, KJ
论文数: 0 引用数: 0
h-index: 0
机构:
Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA

Lester, LF
论文数: 0 引用数: 0
h-index: 0
机构:
Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA
[5]
High characteristic temperature of near-1.3-μm InGaAs/GaAs quantum-dot lasers at room temperature
[J].
Mukai, K
;
Nakata, Y
;
Otsubo, K
;
Sugawara, M
;
Yokoyama, N
;
Ishikawa, H
.
APPLIED PHYSICS LETTERS,
2000, 76 (23)
:3349-3351

Mukai, K
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan

Nakata, Y
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan

Otsubo, K
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan

Sugawara, M
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan

Yokoyama, N
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan

Ishikawa, H
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan
[6]
Suppression of temperature sensitivity of interband emission energy in 1.3-μm-region by an InGaAs overgrowth on self-assembled InGaAs GaAs quantum dots
[J].
Mukai, K
;
Sugawara, M
.
APPLIED PHYSICS LETTERS,
1999, 74 (26)
:3963-3965

Mukai, K
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 24301, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 24301, Japan

Sugawara, M
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 24301, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 24301, Japan
[7]
1.3-μm CW lasing of InGaAs-GaAs quantum dots at room temperature with a threshold current of 8 mA
[J].
Mukai, K
;
Nakata, Y
;
Otsubo, K
;
Sugawara, M
;
Yokoyama, N
;
Ishikawa, H
.
IEEE PHOTONICS TECHNOLOGY LETTERS,
1999, 11 (10)
:1205-1207

Mukai, K
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan

Nakata, Y
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan

Otsubo, K
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan

Sugawara, M
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan

Yokoyama, N
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan

Ishikawa, H
论文数: 0 引用数: 0
h-index: 0
机构:
Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan Fujitsu Labs Ltd, Atsugi, Kanagawa 2430197, Japan
[8]
A narrow photoluminescence linewidth of 21 meV at 1.35 μm from strain-reduced InAs quantum dots covered by In0.2Ga0.8As grown on GaAs substrates
[J].
Nishi, K
;
Saito, H
;
Sugou, S
;
Lee, JS
.
APPLIED PHYSICS LETTERS,
1999, 74 (08)
:1111-1113

Nishi, K
论文数: 0 引用数: 0
h-index: 0
机构: NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Ibaraki, Osaka 3058501, Japan

Saito, H
论文数: 0 引用数: 0
h-index: 0
机构: NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Ibaraki, Osaka 3058501, Japan

Sugou, S
论文数: 0 引用数: 0
h-index: 0
机构: NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Ibaraki, Osaka 3058501, Japan

Lee, JS
论文数: 0 引用数: 0
h-index: 0
机构: NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Ibaraki, Osaka 3058501, Japan
[9]
Room-temperature continuous-wave operation of a single-layered 1.3 μm quantum dot laser
[J].
Park, G
;
Shchekin, OB
;
Csutak, S
;
Huffaker, DL
;
Deppe, DG
.
APPLIED PHYSICS LETTERS,
1999, 75 (21)
:3267-3269

Park, G
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Texas, Dept Elect & Comp Engn, Microelect Res Ctr, Austin, TX 78712 USA Univ Texas, Dept Elect & Comp Engn, Microelect Res Ctr, Austin, TX 78712 USA

Shchekin, OB
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Texas, Dept Elect & Comp Engn, Microelect Res Ctr, Austin, TX 78712 USA Univ Texas, Dept Elect & Comp Engn, Microelect Res Ctr, Austin, TX 78712 USA

Csutak, S
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Texas, Dept Elect & Comp Engn, Microelect Res Ctr, Austin, TX 78712 USA Univ Texas, Dept Elect & Comp Engn, Microelect Res Ctr, Austin, TX 78712 USA

Huffaker, DL
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Texas, Dept Elect & Comp Engn, Microelect Res Ctr, Austin, TX 78712 USA Univ Texas, Dept Elect & Comp Engn, Microelect Res Ctr, Austin, TX 78712 USA

Deppe, DG
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Texas, Dept Elect & Comp Engn, Microelect Res Ctr, Austin, TX 78712 USA Univ Texas, Dept Elect & Comp Engn, Microelect Res Ctr, Austin, TX 78712 USA
[10]
Influence of GaAs capping on the optical properties of InGaAs/GaAs surface quantum dots with 1.5 μm emission
[J].
Saito, H
;
Nishi, K
;
Sugou, S
.
APPLIED PHYSICS LETTERS,
1998, 73 (19)
:2742-2744

Saito, H
论文数: 0 引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Ibaraki 3058501, Japan NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Ibaraki 3058501, Japan

Nishi, K
论文数: 0 引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Ibaraki 3058501, Japan NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Ibaraki 3058501, Japan

Sugou, S
论文数: 0 引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Ibaraki 3058501, Japan NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Ibaraki 3058501, Japan