Random diode arrays and mesoscale physics of large-area semiconductor devices

被引:58
作者
Karpov, VG [1 ]
Compaan, AD [1 ]
Shvydka, D [1 ]
机构
[1] Univ Toledo, Dept Phys & Astron, Toledo, OH 43606 USA
关键词
D O I
10.1103/PhysRevB.69.045325
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Large-area, thin-film semiconductor devices often exhibit strong fluctuations in electronic properties on a mesoscale level that originate from relatively weak microscopic fluctuations in material structures such as grain size, chemical composition, and film thickness. Amplification comes from the fact that electronic transport through potential barriers is exponentially sensitive to the local parameter fluctuations. These effects create new phenomena and establish the physics of large-area, thin-film devices as a distinctive field of its own, quite different from that of microelectronics. We show that (i) large-area semiconductor thin-film devices are intrinsically nonuniform in the lateral directions, (ii) the nonuniformity can span length scales from millimeters to meters depending on external drivers such as light intensity and bias, and (iii) this nonuniformity significantly impacts the performance and stability of, e.g., photovoltaics, liquid crystal displays, and light emitting arrays. From the theoretical standpoint our consideration introduces a new class of disordered systems, which are random diode arrays. We propose a theory describing one class of such arrays and derive a figure of merit that characterizes the significance of nonuniformity effects. Our understanding suggests some methods for blocking the effects of nonuniformities.
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页数:12
相关论文
共 53 条
[21]   Nanometer-scale test of the Tung model of Schottky-barrier height inhomogeneity [J].
Im, HJ ;
Ding, Y ;
Pelz, JP ;
Choyke, WJ .
PHYSICAL REVIEW B, 2001, 64 (07)
[22]   Effects of nonuniformity in thin-film photovoltaics [J].
Karpov, VG ;
Compaan, AD ;
Shvydka, D .
APPLIED PHYSICS LETTERS, 2002, 80 (22) :4256-4258
[23]   Shunt screening, size effects and I/V analysis in thin-film photovoltaics [J].
Karpov, VG ;
Rich, G ;
Subashiev, AV ;
Dorer, G .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (09) :4975-4985
[24]  
KARPOV VG, IN PRESS P 3 WORLD C
[25]   Local current-voltage curves measured thermally (LIVT): A new technique of characterizing PV cells [J].
Konovalov, IE ;
Breitenstein, O ;
Iwig, K .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 1997, 48 (1-4) :53-60
[26]   Spatial distribution of minority-carrier lifetime and local concentration of impurities in multicrystalline silicon solar cells [J].
Kurobe, K ;
Miura, M ;
Hirano, K ;
Matsunami, H .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2002, 74 (1-4) :183-193
[27]   Yield issues on the fabrication of 30 cm x 30 cm-sized Cu(In,Ga)Se2-based thin-film modules [J].
Kushiya, K ;
Ohshita, M ;
Hara, I ;
Tanaka, Y ;
Sang, B ;
Nagoya, Y ;
Tachiyuki, M ;
Yamase, O .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2003, 75 (1-2) :171-178
[28]  
Lifshits I. M., 1988, INTRO THEORY DISORDE
[29]   PHOTOEFFECTS IN NONUNIFORMLY IRRADIATED P-N JUNCTIONS [J].
LUCOVSKY, G .
JOURNAL OF APPLIED PHYSICS, 1960, 31 (06) :1088-1095
[30]   Effect of light intensity on current collection in thin-film solar cells [J].
McMahon, TJ ;
von Roedern, B .
CONFERENCE RECORD OF THE TWENTY SIXTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 1997, 1997, :375-378