共 81 条
[1]
LOW-TEMPERATURE FORCE MICROSCOPE WITH ALL-FIBER INTERFEROMETER
[J].
ULTRAMICROSCOPY,
1992, 42
:1638-1646
[6]
Fast and ultrasensitive nanomechanical displacement detection based on the single electron transistor
[J].
NOISE AND INFORMATION IN NANOELECTRONICS, SENSORS AND STANDARDS,
2003, 5115
:64-73
[9]
BUSCHVISHNIAC JI, 1998, ELECTROMECHANICAL SE
[10]
Measurement of nanomechanical resonant structures in single-crystal silicon
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1998, 16 (06)
:3821-3824