Electron Tunneling through Ultrathin Boron Nitride Crystalline Barriers

被引:719
作者
Britnell, Liam [1 ]
Gorbachev, Roman V. [2 ]
Jalil, Rashid [2 ]
Belle, Branson D. [2 ]
Schedin, Fred [2 ]
Katsnelson, Mikhail I. [3 ]
Eaves, Laurence [4 ]
Morozov, Sergey V. [5 ]
Mayorov, Alexander S. [1 ]
Peres, Nuno M. R. [6 ,7 ,8 ]
Castro Neto, Antonio H. [7 ,8 ]
Leist, Jon [9 ]
Geim, Andre K. [1 ,2 ]
Ponomarenko, Leonid A. [1 ]
Novoselov, Kostya S. [1 ]
机构
[1] Univ Manchester, Sch Phys & Astron, Manchester M13 9PL, Lancs, England
[2] Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England
[3] Radboud Univ Nijmegen, Inst Mol & Mat, NL-6525 AJ Nijmegen, Netherlands
[4] Univ Nottingham, Sch Phys & Astron, Nottingham NG7 2RD, England
[5] Russian Acad Sci, Inst Microelect Technol, Chernogolovka 142432, Russia
[6] Univ Minho, Dept Fis, P-4710057 Braga, Portugal
[7] Natl Univ Singapore, Graphene Res Ctr, Singapore 117542, Singapore
[8] Natl Univ Singapore, Dept Phys, Singapore 117542, Singapore
[9] Moment Performance Mat, Strongsville, OH USA
基金
欧洲研究理事会;
关键词
Electron tunneling; boron nitride; graphene; ultrathin; conductive AFM; GRAPHENE;
D O I
10.1021/nl3002205
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We investigate the electronic properties of ultrathin hexagonal boron nitride (h-BN) crystalline layers with different conducting materials (graphite, graphene, and gold) on either side of the barrier layer. The tunnel current depends exponentially on the number of h-BN atomic layers, down to a monolayer thickness. Conductive atomic force microscopy scans across h-BN terraces of different thickness reveal a high level of uniformity in the tunnel current. Our results demonstrate that atomically thin h-BN acts as a defect-free dielectric with a high breakdown field. It offers great potential for applications in tunnel devices and in field-effect transistors with a high carrier density in the conducting channel.
引用
收藏
页码:1707 / 1710
页数:4
相关论文
共 18 条
[1]   Tunneling spectroscopy of graphene-boron-nitride heterostructures [J].
Amet, F. ;
Williams, J. R. ;
Garcia, A. G. F. ;
Yankowitz, M. ;
Watanabe, K. ;
Taniguchi, T. ;
Goldhaber-Gordon, D. .
PHYSICAL REVIEW B, 2012, 85 (07)
[2]   Field-Effect Tunneling Transistor Based on Vertical Graphene Heterostructures [J].
Britnell, L. ;
Gorbachev, R. V. ;
Jalil, R. ;
Belle, B. D. ;
Schedin, F. ;
Mishchenko, A. ;
Georgiou, T. ;
Katsnelson, M. I. ;
Eaves, L. ;
Morozov, S. V. ;
Peres, N. M. R. ;
Leist, J. ;
Geim, A. K. ;
Novoselov, K. S. ;
Ponomarenko, L. A. .
SCIENCE, 2012, 335 (6071) :947-950
[3]   The electronic properties of graphene [J].
Castro Neto, A. H. ;
Guinea, F. ;
Peres, N. M. R. ;
Novoselov, K. S. ;
Geim, A. K. .
REVIEWS OF MODERN PHYSICS, 2009, 81 (01) :109-162
[4]  
Dean CR, 2011, NAT PHYS, V7, P693, DOI [10.1038/NPHYS2007, 10.1038/nphys2007]
[5]   The rise of graphene [J].
Geim, A. K. ;
Novoselov, K. S. .
NATURE MATERIALS, 2007, 6 (03) :183-191
[6]   Graphene: Status and Prospects [J].
Geim, A. K. .
SCIENCE, 2009, 324 (5934) :1530-1534
[7]   Hunting for Monolayer Boron Nitride: Optical and Raman Signatures [J].
Gorbachev, Roman V. ;
Riaz, Ibtsam ;
Nair, Rahul R. ;
Jalil, Rashid ;
Britnell, Liam ;
Belle, Branson D. ;
Hill, Ernie W. ;
Novoselov, Kostya S. ;
Watanabe, Kenji ;
Taniguchi, Takashi ;
Geim, Andre K. ;
Blake, Peter .
SMALL, 2011, 7 (04) :465-468
[8]   Quasiparticle Band Gap Engineering of Graphene and Graphone on Hexagonal Boron Nitride Substrate [J].
Kharche, Neerav ;
Nayak, Saroj K. .
NANO LETTERS, 2011, 11 (12) :5274-5278
[9]   Electron tunneling through atomically flat and ultrathin hexagonal boron nitride [J].
Lee, Gwan-Hyoung ;
Yu, Young-Jun ;
Lee, Changgu ;
Dean, Cory ;
Shepard, Kenneth L. ;
Kim, Philip ;
Hone, James .
APPLIED PHYSICS LETTERS, 2011, 99 (24)
[10]   Micrometer-Scale Ballistic Transport in Encapsulated Graphene at Room Temperature [J].
Mayorov, Alexander S. ;
Gorbachev, Roman V. ;
Morozov, Sergey V. ;
Britnell, Liam ;
Jalil, Rashid ;
Ponomarenko, Leonid A. ;
Blake, Peter ;
Novoselov, Kostya S. ;
Watanabe, Kenji ;
Taniguchi, Takashi ;
Geim, A. K. .
NANO LETTERS, 2011, 11 (06) :2396-2399