Polarization charges and polarization-induced barriers in AlxGa1-xN/GaN and InyGa1-yN/GaN heterostructures

Polarization charges are measured and the formation of large electrostatic barriers arising primarily as a consequence of the presence of polarization-induced charge densities is deduced from capacitance-voltage analysis of n-type AlxGa1-xN/GaN and InyGa1-yN/GaN heterostructures. In structures consisting of 5-10 nm AlxGa1-xN or InyGa1-yN surrounded by n-GaN, capacitance-voltage profiling studies combined with elementary electrostatic analysis yield experimental estimates of polarization charge densities, which are compared with values expected based on the combined effects of spontaneous and piezoelectric polarization. These results imply the existence of electrostatic barriers that are due primarily to the large polarization charge densities at each heterojunction interface and the resulting potential difference maintained across the thin AlxGa1-xN or InyGa1-yN layers. The electrostatic barriers formed in these structures are large in comparison to the heterojunction conduction-band offsets, demonstrating the utility of polarization-based engineering of electrostatic barriers in nitride semiconductor heterostructures. (C) 2001 American Institute of Physics.