Hard x-ray photoemission spectroscopy in wurtzite-type zinc magnesium oxide solid-solution films grown by pulsed-laser deposition

被引：14

作者：

Ohsawa, Takeo ^{[1
]}

Ohashi, Naoki ^{[1
]}

Adachi, Yutaka ^{[1
]}

Sakaguchi, Isao ^{[1
]}

Ryoken, Haruki ^{[1
]}

Matsumoto, Kenji ^{[1
]}

Haneda, Hajime ^{[1
]}

Ueda, Shigenori ^{[1
]}

Yoshikawa, Hideki ^{[1
]}

Kobayashi, Keisuke ^{[1
]}

机构：

[1] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050044, Japan

来源：

APPLIED PHYSICS LETTERS | 2008年 / 92卷 / 23期

基金：

日本学术振兴会;

关键词：

D O I：

10.1063/1.2942393

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The electronic structure of Zn1-xMgxO alloy thin films was determined by hard x-ray photoemission spectroscopy (HX-PES) and optical transmittance measurements. HX-PES measurements revealed that the binding energies of valence band, Zn 2p, and O 1s levels increased with increasing MgO fraction. The energy shift correlated with a widening of the band gap and change in ionicity of chemical bonds by alloying. The Fermi level in the alloy compounds was found to be close to the bottom of conduction band regardless of the MgO fraction. (C) 2008 American Institute of Physics.

引用

页数：3

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