Surface potential measurement on organic ultrathin film by Kelvin probe force microscopy using a piezoelectric cantilever

被引：9

作者：

Kobayashi, K. ^{[1
]}

Yamada, H. ^{[1
]}

Umeda, K. ^{[1
]}

Horiuchi, T. ^{[1
]}

Watanabe, S. ^{[2
]}

Fujii, T. ^{[2
]}

Hotta, S. ^{[3
]}

Matsushige, K. ^{[1
]}

机构：

[1] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6068501, Japan

[2] Nikon Inc, Optoelect Mat Lab, Sagamihara, Kanagawa 22808028, Japan

[3] Matsushita Elect Ind Co Ltd, Adv Technol Res Labs, Kawasaki, Kanagawa 2148501, Japan

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2001年 / 72卷 / Suppl 1期

关键词：

PACS: 07.79.Lh; 61.16.Ch; 73.61.Ph;

D O I：

10.1007/s003390100641

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We measured surface potential (SP) on a pi-conjugated thiophene oligomer monolayer film deposited on a metallic substrate by Kelvin probe force microscopy using a piezoelectric cantilever. Since the cantilever has a relatively large spring constant (calculated as about 150 N/m), the frequency modulation detection method was used for tip-sample distance regulation in order to achieve high-sensitivity SP measurement. A contact potential difference between monolayer regions and the metallic substrate was clearly observed in an SP image. Furthermore, an apparent change in a contrast of the SP image was observed while the sample was irradiated with ultraviolet light.

引用

页码：S97 / S100

页数：4

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