Initial stage for heteroepitaxy of 3C-SiC on the Si(001) surface in dimethylgermane source molecular beam epitaxy

被引:27
作者
Hatayama, T
Tanaka, N
Fuyuki, T
Matsunami, H
机构
[1] Dept. of Electronics Sci. and Eng., Sakyo, Kyoto 606-01, Yoshidahonmachi
关键词
D O I
10.1063/1.118569
中图分类号
O59 [应用物理学];
学科分类号
摘要
By the use of dimethylgermane [(CH3)(2)GeH2:DMGe], a Si clean surface can be carbonized reproducibly at as low as 650 degrees C in a gas source molecular beam epitaxy. The initial stage for heteroepitaxy in the 3C-SiC/Si system has been studied with time resolved in situ reflection high-energy electron diffraction (RHEED) analysis. A RHEED pattern from a carbonized layer indicates single-crystalline 3C-SiC without any 3C-SiC twin spots and Ge-related patterns. An activation energy of about 51.1 kcal/mol is obtained in the initial stage of 3C-SiC growth. The successive growth of 3C-SiC layers formed with DMGe is also discussed. (C) 1997 American Institute of Physics.
引用
收藏
页码:1411 / 1413
页数:3
相关论文
共 16 条
[1]  
[Anonymous], METHODS SURFACE ANAL
[2]   SCANNING-TUNNELING-MICROSCOPY STUDY OF THE ADSORPTION OF C-60 MOLECULES ON SI(100)-(2X1) SURFACES [J].
CHEN, D ;
GALLAGHER, MJ ;
SARID, D .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03) :1947-1951
[3]   CONTROLLED CARBONIZATION OF SI(001) SURFACE USING HYDROCARBON RADICALS IN ULTRAHIGH-VACUUM [J].
HATAYAMA, T ;
TARUI, Y ;
YOSHINOBU, T ;
FUYUKI, T ;
MATSUNAMI, H .
JOURNAL OF CRYSTAL GROWTH, 1994, 136 (1-4) :333-337
[4]   Time-resolved reflection high-energy electron diffraction analysis in initial stage of 3C-SiC growth on Si(001) by gas source molecular beam epitaxy [J].
Hatayama, T ;
Fuyuki, T ;
Matsunami, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (10) :5255-5260
[5]   LOW-TEMPERATURE HETEROEPITAXIAL GROWTH OF CUBIC SIC ON SI USING HYDROCARBON RADICALS BY GAS-SOURCE MOLECULAR-BEAM EPITAXY [J].
HATAYAMA, T ;
TARUI, Y ;
FUYUKI, T ;
MATSUNAMI, H .
JOURNAL OF CRYSTAL GROWTH, 1995, 150 (1-4) :934-938
[6]   QUANTITATIVE-ANALYSIS FOR CH3 RADICALS IN LOW-TEMPERATURE GROWTH OF 3C-SIC ON SI(001) CLEAN SURFACE [J].
HATAYAMA, T ;
FUYUKI, T ;
MATSUNAMI, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1995, 34 (9A) :L1117-L1120
[7]  
HATAYAMA T, 1995, P 6 INT C SIC REL MA, P117
[8]   SI(100)-C(4X4) METASTABLE SURFACE OBSERVED BY SCANNING TUNNELING MICROSCOPY [J].
IDE, T ;
MIZUTANI, T .
PHYSICAL REVIEW B, 1992, 45 (03) :1447-1449
[9]   FORMATION AND ATOMIC CONFIGURATION OF SI(100)C(4X4) STRUCTURE [J].
KATO, K ;
IDE, T ;
NISHIMORI, T ;
ICHINOKAWA, T .
SURFACE SCIENCE, 1988, 207 (01) :177-185
[10]   HETERO-EPITAXIAL GROWTH OF CUBIC SILICON-CARBIDE ON FOREIGN SUBSTRATES [J].
MATSUNAMI, H ;
NISHINO, S ;
ONO, H .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (10) :1235-1236