Cluster imaging with a direct detection CMOS pixel sensor in Transmission Electron Microscopy

被引:37
作者
Battaglia, Marco [1 ,2 ]
Contarato, Devis [1 ]
Denes, Peter [1 ]
Giubilato, Piero [1 ,3 ]
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
[3] Univ Padua, Dipartimento Fis, I-35131 Padua, Italy
关键词
Monolithic active pixel sensor; Transmission Electron Microscopy; SIMULATION;
D O I
10.1016/j.nima.2009.07.017
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A cluster imaging technique for Transmission Electron Microscopy with a direct detection CMOS pixel sensor is presented. Charge centre-of-gravity reconstruction for individual electron clusters improves the spatial resolution and thus the point spread function. Data collected with a CIVICS sensor with 9.5 x 9.5 mu m(2) pixels show an improvement of a factor of two in point spread function to 2.7 mu m at 300 keV and of a factor of three in the image contrast, compared to traditional bright field illumination. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:363 / 365
页数:3
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