Electron distribution and capacitance-voltage profiles of multiple quantum well structure from self-consistent simulations

被引:18
作者
Moon, CR [1 ]
Choe, BD [1 ]
Kwon, SD [1 ]
Lim, H [1 ]
机构
[1] AJOU UNIV,DEPT PHYS,SUWON 442749,SOUTH KOREA
关键词
D O I
10.1063/1.118765
中图分类号
O59 [应用物理学];
学科分类号
摘要
Carrier profiles of multiple quantum wells are studied using self-consistent simulations. The free carrier density of the well is found to be distributed nonuniformly and symmetrically, although the doping level in barriers is uniform. The calculated apparent carrier density obtainable from the capacitance-voltage profile is found to be distributed asymmetrically. Simulation results show that, even if electrons are confined in quantum wells, the apparent electron distribution can be flattened if barrier thickness or doping level in barriers are reduced to such an extent that the Debye length is comparable to the barrier thickness. (C) 1997 American Institute of Physics.
引用
收藏
页码:2987 / 2989
页数:3
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