Improved performances of InGaP Schottky contact with Ti/Pt/Au metals and MSM photodetectors by (NH4)(2)S-x treatment

被引:20
作者
Lee, CT
Lan, MH
Tsai, CD
机构
[1] Institute of Optical Sciences, National Central University, Chung-Li
关键词
D O I
10.1016/S0038-1101(97)00159-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To extend the high performances of the GaAs MSM photodetectors with InGaP buffer and capping layers, the (NH4)(2)S-x treatment of InGaP is investigated. The surface states are reduced by sulfur passivation. Whereupon, the performances of InGaP Schottky contact with Ti/Pt/Au metals are improved. The improved dark current and insensitive responsivity with incident optical power are demonstrated by suitable process control of sulfur passivation. (C) 1997 Elsevier Science Ltd.
引用
收藏
页码:1715 / 1719
页数:5
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