Single crystal SrTiO3 field-effect transistor with an atomically flat amorphous CaHfO3 gate insulator

被引:53
作者
Shibuya, K
Ohnishi, T
Lippmaa, M
Kawasaki, M
Koinuma, H
机构
[1] Univ Tokyo, Inst Solid State Phys, Chiba 2778581, Japan
[2] Tohoku Univ, Inst Mat Res, Aoba Ku, Sendai, Miyagi 9808577, Japan
[3] Tokyo Inst Technol, Mat & Struct Lab, Midori Ku, Yokohama, Kanagawa 2268503, Japan
[4] Combinatorial Mat Explorat & Technol, Tsukuba, Ibaraki 3050044, Japan
[5] Natl Inst Adv Ind Sci & Technol, Correlated Electron Res Ctr, Tsukuba, Ibaraki 3050046, Japan
关键词
D O I
10.1063/1.1773361
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have observed prominent transistor action in a transition-metal oxide which is not traditionally viewed as a semiconductor. We have fabricated a field-effect transistor composed of SrTiO3(100) single crystal as a channel and an amorphous CaHfO3 layer as a gate insulator. The amorphous CaHfO3 gate insulator layer was atomically flat and had a breakdown field of over 5 MV/cm. All electrode and channel patterning was done with simple contact masks. The whole fabrication process took place at room temperature. The device showed a field-effect mobility of 0.4-0.5 cm(2)/V s and an on-to-off channel current ratio of similar to10(5) at room temperature. (C) 2004 American Institute of Physics.
引用
收藏
页码:425 / 427
页数:3
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