Lateral-force measurements in dynamic force microscopy -: art. no. 161403

被引：65

作者：

Pfeiffer, O

Bennewitz, R

Baratoff, A

Meyer, E

Grütter, P

机构：

[1] Univ Basel, Dept Phys, CH-4058 Basel, Switzerland

[2] McGill Univ, Dept Phys, Montreal, PQ H3A 2T8, Canada

来源：

PHYSICAL REVIEW B | 2002年 / 65卷 / 16期

关键词：

D O I：

10.1103/PhysRevB.65.161403

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Lateral forces between the tip of a force microscope and atomic-scale features on the surface of a sample can be accurately measured in a noncontact mode. Feedback-controlled excitation of the torsional eigenmode of a rectangular cantilever beam forces the tip to oscillate parallel to the surface. Forces of the order of 0.05 nN have been detected when the tip approaches a step or a sulphur impurity. The method can also be used to study the energy dissipation in the range where a tip-sample contact is formed.

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页码：1 / 4

页数：4

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