Nanostructures and carrier localization behaviors of green-luminescence InGaN/GaN quantum-well structures of various silicon-doping conditions

被引:51
作者
Cheng, YC
Lin, EC
Wu, CM
Yang, CC
Yang, JR
Rosenauer, A
Ma, KJ
Shi, SC
Chen, LC
Pan, CC
Chyi, JI
机构
[1] Natl Taiwan Univ, Grad Inst Electroopt Engn, Taipei 10764, Taiwan
[2] Natl Taiwan Univ, Grad Inst Elect Engn, Taipei 10764, Taiwan
[3] Natl Taiwan Univ, Dept Elect Engn, Taipei 10764, Taiwan
[4] Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10764, Taiwan
[5] Univ Karlsruhe, Lab Elektronenmikroskopie, D-76128 Karlsruhe, Germany
[6] Chung Hua Univ, Dept Mech Engn, Hsinchu, Taiwan
[7] Natl Taiwan Univ, Ctr Condensed Matter Sci, Taipei 10764, Taiwan
[8] Natl Cent Univ, Dept Elect Engn, Chungli 32054, Taiwan
关键词
D O I
10.1063/1.1690872
中图分类号
O59 [应用物理学];
学科分类号
摘要
The results of photoluminescence (PL), detection-energy-dependent photoluminescence excitation (DEDPLE), excitation-energy-dependent photoluminescence (EEDPL), and strain state analysis (SSA) of three InGaN/GaN quantum-well (QW) samples with silicon doping in the well, barrier and an undoped structure are compared. The SSA images show strongly clustering nanostructures in the barrier-doped sample and relatively weaker composition fluctuations in the undoped and well-doped samples. Differences in silicon doping between the samples give rise to the differences in DEDPLE and EEDPL spectra, as a result of the differences in carrier localization. In addition, the PL results provide us clues for speculating that the S-shaped PL peak position behavior is dominated by the quantum-confined Stark effect in an undoped InGaN/GaN QW structure. (C) 2004 American Institute of Physics.
引用
收藏
页码:2506 / 2508
页数:3
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