Lateral oxidation of AlAs layers at elevated water vapour pressure using a closed-chamber system

被引:8
作者
Choe, JS [1 ]
Park, SH
Choe, BD
Jeon, H
机构
[1] Seoul Natl Univ, Dept Phys, Seoul 151742, South Korea
[2] Seoul Natl Univ, Interuniv Semicond Res Ctr, Seoul 151742, South Korea
关键词
D O I
10.1088/0268-1242/15/10/102
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have oxidized AlAs layers laterally in a new type of oxidation system equipped with a closed chamber, in which the vapour pressure of water can be varied over a wide range as a function of the water temperature. Up to a fourfold increase in oxidation speed has been demonstrated with the new system. More strikingly, the saturation effect of the speed of oxidation, known to be caused by a dense As2O3-containing region at the oxidation front, appears to be eventually relieved and another oxidation evolution stage begins. This observation, which we believe has been made for the first time, was possible mainly owing to the much extended oxidation time that the closed-chamber system offers. Additionally, there is no active gas flow involved in this new oxidation method and therefore an improved spatial uniformity in oxidation is expected.
引用
收藏
页码:L35 / L38
页数:4
相关论文
共 11 条
[1]   Origin of the time dependence of wet oxidation of AlGaAs [J].
Ashby, CIH ;
Bridges, MM ;
Allerman, AA ;
Hammons, BE ;
Hou, HQ .
APPLIED PHYSICS LETTERS, 1999, 75 (01) :73-75
[2]  
*CHEM RUBB CO, 1994, HDB CHEM PHYS
[3]   ALXGA1-XAS-GAAS METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS FORMED BY LATERAL WATER-VAPOR OXIDATION OF ALAS [J].
CHEN, EI ;
HOLONYAK, N ;
MARANOWSKI, SA .
APPLIED PHYSICS LETTERS, 1995, 66 (20) :2688-2690
[4]   Effect of wet oxidized AlxGa1-xAs layer on the interdiffusion of InGaAs/GaAs quantum wells [J].
Choe, JS ;
Ryu, SW ;
Choe, BD ;
Lim, H .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (11) :5779-5782
[5]   GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON [J].
DEAL, BE ;
GROVE, AS .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) :3770-&
[6]   Lateral oxidation of InAlAs in InP-based heterostructures for long wavelength vertical cavity surface emitting laser applications [J].
Gebretsadik, H ;
Kamath, K ;
Zhou, WD ;
Bhattacharya, P ;
Caneau, C ;
Bhat, R .
APPLIED PHYSICS LETTERS, 1998, 72 (02) :135-137
[7]   HIGH-REFLECTIVITY VISIBLE-WAVELENGTH SEMICONDUCTOR NATIVE-OXIDE BRAGG REFLECTORS GROWN BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION [J].
HOLMES, AL ;
ISLAM, MR ;
CHELAKARA, RV ;
CIUBA, FJ ;
DUPUIS, RD ;
RIES, MJ ;
CHEN, EI ;
MARANOWSKI, SA ;
HOLONYAK, N .
APPLIED PHYSICS LETTERS, 1995, 66 (21) :2831-2833
[8]   NATIVE-OXIDE DEFINED RING CONTACT FOR LOW-THRESHOLD VERTICAL-CAVITY LASERS [J].
HUFFAKER, DL ;
DEPPE, DG ;
KUMAR, K ;
ROGERS, TJ .
APPLIED PHYSICS LETTERS, 1994, 65 (01) :97-99
[9]   SELECTIVELY OXIDIZED VERTICAL-CAVITY SURFACE-EMITTING LASERS WITH 50-PERCENT POWER CONVERSION EFFICIENCY [J].
LEAR, KL ;
CHOQUETTE, KD ;
SCHNEIDER, RP ;
KILCOYNE, SP ;
GEIB, KM .
ELECTRONICS LETTERS, 1995, 31 (03) :208-209
[10]  
LEE JK, 2000, COMMUNICATION