Low LET cross-section measurements using high energy carbon beam

被引：25

作者：

Ecoffet, R

Duzellier, S

Falguere, D

Guibert, L

Inguimbert, C

机构：

[1] Ctr Natl Etud Spatiales, F-31055 Toulouse, France

[2] DERTS, CERT, ONERA, F-31055 Toulouse, France

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1997年 / 44卷 / 06期

关键词：

D O I：

10.1109/23.659040

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper reports on results from high energy heavy ion testing of devices. The low LET zones of the cross-section curves are explored. High and low energy measurements are compared.

引用

页码：2230 / 2236

页数：7

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