Formation of parallel X-ray microbeam and its application

We have developed a parallel X-ray microbeam of 7 x 5 mu m(2) in size with a small angular divergence, which aims high-resolution strain measurements in a very local area. The microbeam has been formed by compressing and collimating the X-rays from a third-generation undulator source using successive asymmetric reflections. Using this beam, we have evaluated the strain induced by field oxidation in silicon wafers by rocking curve measurements. We have observed that the lattice constant in the Si region near the oxide film edge is contracted and that in the SiO2/Si region is extended. The difference between these lattice constants is as small as about Delta d/d similar to +/-5 x 10(-6).