Development of a near-field scanning microwave microscope using a tunable resonance cavity for high resolution

被引:63
作者
Kim, J
Kim, MS
Lee, K
Lee, J
Cha, DJ
Friedman, B
机构
[1] Sogang Univ, Dept Phys, Seoul 121742, South Korea
[2] Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan
[3] Kunsan Natl Univ, Dept Phys, Kunsan, South Korea
[4] Sam Houston State Univ, Dept Phys, Huntsville, TX 77341 USA
关键词
scanning probe microscope; near-field scanning microwave microscope; YBa2Cu3Oy thin film; near-field;
D O I
10.1088/0957-0233/14/1/302
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report on the operational principles and the practical implementation of a near-field scanning microwave microscope system consisting of lambda/4 coaxial resonator with a tunable resonance cavity coupled to a sharp probe tip. The changes of sensitivity and spatial resolution as a function of cavity length are clearly modulated by tuning the resonance cavity. By tuning the resonance cavity, we demonstrate improved sensitivity and spatial resolution better than 4 (mmu) of the near-field images of a YBa2Cu3Oy thin film on a MgO substrate at an operating frequency of f = 1-1.5 GHz. We modelled the lambda/4 coaxial resonator by a LCR circuit and the principles of operation can be explained by using perturbation theory, considering the radius of the probe tip, the quality factor, impedance matching, and the sample-tip distance.
引用
收藏
页码:7 / 12
页数:6
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