Characteristics of RuO2-SnO2 nanocrystalline-embedded amorphous electrode for thin film microsupercapacitors

被引:26
作者
Kim, HK
Choi, SH
Yoon, YS
Chang, SY
Ok, YW
Seong, TY
机构
[1] Samsung SDI, Core Technol Lab, Suwon 442391, Gyeonggi Do, South Korea
[2] Korea Inst Sci & Technol, Nano Mat Res Ctr, Seoul 130650, South Korea
[3] Konkuk Univ, DAFT, Seoul 143701, South Korea
[4] Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju 500712, South Korea
关键词
RuO2; SnO2; nanocrystalline; capacitance; supercapacitor;
D O I
10.1016/j.tsf.2004.08.057
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The characteristics of RuO2-SnO2 nanocrystalline-embedded amorphous electrode, grown by DC reactive sputtering, was investigated. X-ray diffraction (XRD), transmission electron microscopy (TEM), and transmission electron diffraction (TED) examination results showed that Sn and Ru metal cosputtered electrode in O-2/Ar ambient have RuO2-SnO2 nanocrystallines in an amorphous oxide matrix. It is shown that the cyclic voltammorgram (CV) result of the RuO2-SnO2 nanocrystalline-embedded amorphous film in 0.5 M H2SO4 liquid electrolyte is similar to a bulk-type supercapacitor behavior with a specific capacitance of 62.2 mF/cm(2) mum. This suggests that the RuO2-SnO2 nanocrystalline-embedded amorphous film can be employed in hybrid all-solid state energy storage devises as an electrode of supercapacitor. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:54 / 57
页数:4
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