Characterization of the Schottky barrier in SrRuO3/Nb:SrTiO3 junctions

被引:72
作者
Hikita, Y. [1 ]
Kozuka, Y. [1 ]
Susaki, T. [1 ]
Takagi, H. [1 ]
Hwang, H. Y. [1 ]
机构
[1] Univ Tokyo, Dept Adv Mat Sci & Engn, Kashiwa, Chiba 2778561, Japan
关键词
D O I
10.1063/1.2719157
中图分类号
O59 [应用物理学];
学科分类号
摘要
Internal photoemission spectroscopy was used to determine the Schottky barrier height in rectifying SrRuO3/Nb-doped SrTiO3 junctions for 0.01 and 0.5 wt % Nb concentrations. Good agreement was obtained with the barrier height deduced from capacitance-voltage measurements, provided that a model of the nonlinear permittivity of SrTiO3 was incorporated in extrapolating the built-in potential, particularly for high Nb concentrations. Given the generic polarizability of perovskites under internal/external electric fields, internal photoemission provides a valuable independent probe of the interface electronic structure. (c) 2007 American Institute of Physics.
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页数:3
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