Low-resistance Ti/Au ohmic contacts to Al-doped ZnO layers

被引:116
作者
Kim, HK [1 ]
Han, SH
Seong, TY
Choi, WK
机构
[1] Kwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju 500712, South Korea
[2] Korea Inst Sci & Technol, Thin Film Technol Res Ctr, Seoul 130720, South Korea
关键词
D O I
10.1063/1.1308527
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on low-resistance ohmic contacts to the moderately doped n-type ZnO:Al(n(d)=2x10(17) cm(-3)) obtained using Ti (30 nm)/Au (50 nm) metallization schemes. Annealed Ti/Au contacts exhibit linear current-voltage characteristics, showing that high-quality ohmic contacts are formed. The Ti/Au scheme produces a specific contact resistance of 2x10(-4) Omega cm(2) when annealed at 300 degrees C for 1 min in a N-2 atmosphere. (C) 2000 American Institute of Physics. [S0003-6951(00)00537-4].
引用
收藏
页码:1647 / 1649
页数:3
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