Novel diffusion mechanism on the GaAs(001) surface: The role of adatom-dimer interaction

被引:155
作者
Kley, A [1 ]
Ruggerone, P [1 ]
Scheffler, M [1 ]
机构
[1] Max Planck Gesell, Fritz Haber Inst, D-14195 Berlin, Dahlem, Germany
关键词
D O I
10.1103/PhysRevLett.79.5278
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Employing first principles total energy calculations we have studied the behavior of Ga and Al adatoms on the GaAs(001)-beta 2 surface. Beside the adsorption site we identify two diffusion channels that are characterized by different adatom-surface dimer interaction. Both affect the adatom migration: in one channel the adatom jumps across the surface dimers and leaves the dimer bonds intact; in the other one the dimer bonds are broken. The two channels are taken into account to derive effective adatom diffusion barriers. We find a strong diffusion anisotropy for both Al and Ga adatoms and, in agreement with experiments, higher diffusion barriers for Al than for Ga.
引用
收藏
页码:5278 / 5281
页数:4
相关论文
共 30 条
[1]   PSEUDOPOTENTIALS THAT WORK - FROM H TO PU [J].
BACHELET, GB ;
HAMANN, DR ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1982, 26 (08) :4199-4228
[2]   RECONSTRUCTIONS OF GAAS AND AIAS SURFACES AS A FUNCTION OF METAL TO AS RATIO [J].
BACHRACH, RZ ;
BAUER, RS ;
CHIARADIA, P ;
HANSSON, GV .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03) :335-343
[3]   BINDING AND DIFFUSION OF A SI ADATOM ON THE SI(100) SURFACE [J].
BROCKS, G ;
KELLY, PJ ;
CAR, R .
PHYSICAL REVIEW LETTERS, 1991, 66 (13) :1729-1732
[4]   HUGE ELECTRIC-FIELDS IN GE/GAAS (001) AND (111) SUPERLATTICES AND THEIR EFFECT ON INTERFACIAL STABILITY [J].
BYLANDER, DM ;
KLEINMAN, L .
PHYSICAL REVIEW B, 1990, 41 (06) :3509-3512
[5]   RECONSTRUCTION AND DEFECT STRUCTURE OF VICINAL GAAS(001) AND ALXGA1-XAS(001) SURFACES DURING MBE GROWTH [J].
DAWERITZ, L ;
HEY, R .
SURFACE SCIENCE, 1990, 236 (1-2) :15-22
[6]   STRUCTURES OF AS-RICH GAAS(001)-(2X4) RECONSTRUCTIONS [J].
HASHIZUME, T ;
XUE, QK ;
ZHOU, J ;
ICHIMIYA, A ;
SAKURAI, T .
PHYSICAL REVIEW LETTERS, 1994, 73 (16) :2208-2211
[7]   SURFACE-DIFFUSION LENGTH OBSERVED BY INSITU SCANNING MICROPROBE REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION [J].
HATA, M ;
WATANABE, A ;
ISU, T .
JOURNAL OF CRYSTAL GROWTH, 1991, 111 (1-4) :83-87
[8]  
HAUS JW, 1987, PHYS REP, V150, P264
[9]  
HORIKOSHI Y, 1986, JPN J APPL PHYS, V25, P1868
[10]  
Hove J. V., 1987, J CRYST GROWTH, V81, P13