Characterization of detector-grade CdZnTe crystals grown by traveling heater method (THM.)

被引：58

作者：

Awadalla, S. A. ^{[1
]}

Mackenzie, J. ^{[1
]}

Chen, H. ^{[1
]}

Redden, B. ^{[1
]}

Bindley, G. ^{[1
]}

Duff, M. C. ^{[2
]}

Burger, A. ^{[3
]}

Groza, M. ^{[3
]}

Buliga, V. ^{[3
]}

Bradley, J. P. ^{[4
]}

Dai, Z. R. ^{[4
]}

Teslich, N. ^{[4
]}

Black, D. R. ^{[5
]}

机构：

[1] Redlen Technol, Sidney, BC V8L 5Y8, Canada

[2] Savannah River Natl Lab, Aiken, SC 29808 USA

[3] Fisk Univ, Nashville, TN 37208 USA

[4] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[5] NIST, Gaithersburg, MD 20899 USA

来源：

JOURNAL OF CRYSTAL GROWTH | 2010年 / 312卷 / 04期

基金：

美国国家科学基金会;

关键词：

CZT; THM; Secondary phases; Surface treatment; SEMIINSULATING CDZNTE; CDTE; PERFORMANCE;

D O I：

10.1016/j.jcrysgro.2009.11.007

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

This work focuses on the 3. Results and discussion characterization of 10 x 10 x 1 0 mm(3) THM-grown CdZnTe detector-grade crystals that have been post-growth annealed to remove the secondary phases (SPs). All three detectors showed an average energy resolution of similar to 1.63% for a small guarded pixel with 3.5 min diameter, measured using Cs-137-662 keV with an average peak-to-Compton ratio of 2.7. The characterization showed vestiges of SPs and micro-twins present in some of the crystals indicating that the SPs prior to annealing were large and had size in the range of 100-500 mu m. The various detectable structural features, such as micron twins, strains and sub-micron level of Te inclusions seemed to have little or no influence in the radiation spectrometer performance of the detectors; this is possibly because they are either having low density or electrically inactive. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：507 / 513

页数：7

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