Characterization of heterogeneities in detector-grade CdZnTe crystals

被引：22

作者：

Duff, M. C. ^{[1
]}

Hunter, D. B. ^{[1
]}

Burger, A. ^{[2
]}

Groza, M. ^{[2
]}

Buliga, V. ^{[2
]}

Bradley, J. P. ^{[3
]}

Graham, G. ^{[3
]}

Dai, Z. R. ^{[3
]}

Teslich, N. ^{[3
]}

Black, D. R. ^{[4
]}

Lanzirotti, A. ^{[5
]}

机构：

[1] Westinghouse Savannah River Co, Savannah River Lab, Aiken, SC 29808 USA

[2] Fisk Univ, Nashville, TN 37208 USA

[3] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[4] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA

[5] Univ Chicago, CARS, Natl Synchrotron Light Source, Brookhaven Natl Lab, Upton, NY 11973 USA

来源：

JOURNAL OF MATERIALS RESEARCH | 2009年 / 24卷 / 04期

基金：

美国能源部; 美国国家科学基金会;

关键词：

CADMIUM ZINC TELLURIDE; DEFECTS; GROWTH; CDTE; PERFORMANCE; SEGREGATION;

D O I：

10.1557/JMR.2009.0165

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Synthetic Cd1-xZnxTe or "CZT" crystals are highly suitable for gamma-spectrometers, operating at room temperature. Secondary phases (SP) within CZT, presumed to be Te metal, have detrimental impacts on the charge collection efficiency of fabricated device. Using analytical techniques rather than arbitrary theoretical definitions, we identify two SP morphologies: (i) many void, 20-mu m "negative" crystals with 65-nm nanoparticle residues of Si, Cd, Zn, and Te and (ii) 20-mu m hexagonal-shaped bodies, which are composites of metallic Te layers with cores of amorphous and polycrystalline CZT material that surround the voids.

引用

页码：1361 / 1367

页数：7

共 22 条

[1] CD1-XZNXTE4 GAMMA-RAY DETECTORS [J].

BUTLER, JF ;

LINGREN, CL ;

DOTY, FP .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1992, 39 (04) :605-609

[2] Effect of Te precipitates on the performance of CdZnTe detectors [J].

Carini, GA ;

Bolotnikov, AE ;

Camarda, GS ;

Wright, GW ;

James, RB ;

Li, L .

APPLIED PHYSICS LETTERS, 2006, 88 (14)

[3]

CHEN H, 2007, IEEE T NUCL SCI, V6, P3809

[4] Effect of surface preparation technique on the radiation detector performance of CdZnTe [J].

Duff, M. C. ;

Hunter, D. B. ;

Burger, A. ;

Groza, M. ;

Buliga, V. ;

Black, D. R. .

APPLIED SURFACE SCIENCE, 2008, 254 (09) :2889-2892

[5] Synchrotron X-ray based characterization of CdZnTe crystals [J].

Duff, Martine C. ;

Hunter, Douglas B. ;

Nuessle, Patterson ;

Black, David R. ;

Burdette, Harold ;

Woicik, Joseph ;

Burger, Arnold ;

Groza, Michael .

JOURNAL OF ELECTRONIC MATERIALS, 2007, 36 (08) :1092-1097

[6] Analysis of grain boundaries, twin boundaries and Te precipitates in Cd1-xZnxTe grown by high-pressure Bridgman method [J].

Heffelfinger, JR ;

Medlin, DL ;

James, RB .

SEMICONDUCTORS FOR ROOM-TEMPERATURE RADIATION DETECTOR APPLICATIONS II, 1997, 487 :33-38

[7]

Li L., 2003, SPIE P SER, V4784, P76, DOI DOI 10.1117/12.453826

[8] Factors affecting energy resolution of coplanar-grid CdZnTe detectors [J].

Luke, PN ;

Amman, M ;

Lee, JS .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2004, 51 (03) :1199-1203

[9] Correlation between bulk material defects and spectroscopic response in cadmium zinc telluride detectors [J].

Parker, BH ;

Stahle, CM ;

Barthelmy, SD ;

Parsons, AM ;

Tueller, J ;

Van Sant, JT ;

Munoz, BF ;

Snodgrass, SJ ;

Mullinix, RE .

HARD X-RAY, GAMMA-RAY, AND NEUTRON DETECTOR PHYSICS, 1999, 3768 :129-137

[10] THE SEGREGATION OF IMPURITIES AND THE SELF-COMPENSATION PROBLEM IN II-VI COMPOUNDS [J].

PAUTRAT, JL ;

MAGNEA, N ;

FAURIE, JP .

JOURNAL OF APPLIED PHYSICS, 1982, 53 (12) :8668-8677

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