Principles of strain relaxation in heteroepitaxial films growing on compliant substrates

被引:27
作者
Kästner, G [1 ]
Gösele, U [1 ]
机构
[1] Max Planck Inst Microstruct Phys, D-01620 Halle, Germany
关键词
D O I
10.1063/1.1289810
中图分类号
O59 [应用物理学];
学科分类号
摘要
In spite of various reports that the density of misfit dislocations threading a growing heteroepitaxial thin film can be considerably reduced by means of using a "compliant substrate," the underlying physical mechanisms are not well understood. The common theoretical models suppose that the growing film can preferably relax in an elastic way by slipping on this kind of substrate. This idea, however, requires us to suppose macroscopic slip displacements. Such displacements are disregarded in the common theories and not reported to occur experimentally. This very doubtful free-slipping hypothesis has been used to establish a force balance ("strain partitioning") between the growing film and the template layer below it and, consequently, to theoretically derive an enhanced critical thickness for the onset of slip of misfit dislocations. In the present article, more realistic mechanisms are discussed, including early plastic relaxation at a low film thickness where multiplicative interaction of dislocations hardly occurs. Possibilities for an enhanced elastic relaxation of the film in the case of Stranski-Krastanow island growth are discussed. (C) 2000 American Institute of Physics. [S0021-8979(00)09119-2].
引用
收藏
页码:4048 / 4055
页数:8
相关论文
共 41 条
  • [1] Influence of interface dislocations on surface kinetics during epitaxial growth of InGaAs
    Alvarez, AL
    Calle, F
    Valtuena, JF
    Faura, J
    Sanchez, MA
    Calleja, E
    Munoz, E
    Morante, JR
    Gonzalez, D
    Araujo, D
    Roja, RG
    [J]. APPLIED SURFACE SCIENCE, 1998, 123 : 303 - 307
  • [2] ASEEV AL, COMMUNICATION
  • [3] Microstructure of epitaxial (InGa)As on a borosilicate glass-bonded compliant substrate
    Babcock, SE
    Dunn, KA
    Zhou, M
    Reeves, JL
    Kuech, TF
    Hansen, DM
    Moran, PD
    [J]. INTERGRANULAR AND INTERPHASE BOUNDARIES IN MATERIALS, IIB98, 1999, 294-2 : 783 - 786
  • [4] Melting induced by epitaxial stress
    Bottomley, DJ
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (5A): : 2652 - 2655
  • [5] Improved quality GaN by growth on compliant silicon-on-insulator substrates using metalorganic chemical vapor deposition
    Cao, J
    Pavlidis, D
    Park, Y
    Singh, J
    Eisenbach, A
    [J]. JOURNAL OF APPLIED PHYSICS, 1998, 83 (07) : 3829 - 3834
  • [6] Metastability modeling of compliant substrate critical thickness using experimental strain relief data
    CarterComan, C
    BicknellTassius, R
    Brown, AS
    Jokerst, NM
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (10) : 1344 - 1346
  • [7] Photoluminescence and X-ray characterization of relaxed Si1-xGex alloys grown on silicon on insulator (SOI) and implanted SOI substrates
    Chu, MA
    Tanner, MO
    Huang, FY
    Wang, KL
    Chu, GG
    Goorsky, MS
    [J]. JOURNAL OF CRYSTAL GROWTH, 1997, 175 : 1278 - 1283
  • [8] CRISTIANSEN S, 1994, APPL PHYS LETT, V64, P3617
  • [9] DISLOCATION-FREE STRANSKI-KRASTANOW GROWTH OF GE ON SI(100)
    EAGLESHAM, DJ
    CERULLO, M
    [J]. PHYSICAL REVIEW LETTERS, 1990, 64 (16) : 1943 - 1946
  • [10] Dislocation-free InSb grown on GaAs compliant universal substrates
    Ejeckam, FE
    Seaford, ML
    Lo, YH
    Hou, HQ
    Hammons, BE
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (06) : 776 - 778