GROWTH OF EPITAXIAL NISI2 ON SI(111) AT ROOM-TEMPERATURE

被引:43
作者
TUNG, RT
SCHREY, F
机构
关键词
D O I
10.1063/1.102385
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:256 / 258
页数:3
相关论文
共 37 条
[1]   VALENCE PHOTOEMISSION-STUDY OF TEMPERATURE-DEPENDENT REACTION-PRODUCTS IN NI-SI INTERFACES AND THIN-FILMS [J].
ABBATI, I ;
BRAICOVICH, L ;
DEMICHELIS, B ;
DELPENNINO, U ;
VALERI, S .
SOLID STATE COMMUNICATIONS, 1982, 43 (03) :199-202
[2]  
BAGLIN J, 1980, ELECTROCHEM SOC S P, P341
[3]   SILICON METAL SILICIDE HETEROSTRUCTURES GROWN BY MOLECULAR-BEAM EPITAXY [J].
BEAN, JC ;
POATE, JM .
APPLIED PHYSICS LETTERS, 1980, 37 (07) :643-646
[4]   PHASE-FORMATION DIAGRAM FOR PRECURSORS TO EPITAXIAL-GROWTH OF NISI2 ON SI(111) [J].
BENNETT, PA ;
JOHNSON, AP ;
HALAWITH, BN .
PHYSICAL REVIEW B, 1988, 37 (08) :4268-4271
[5]   THIN-FILM CRYSTALLOGRAPHY USING REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION ROD INTENSITY PROFILES - NI/SI(111) [J].
BENNETT, PA ;
TONG, X ;
BUTLER, JR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (04) :1336-1340
[6]   ELECTRONIC-STRUCTURE AND PROPERTIES OF NI-SI(001) AND NI-SI(111) REACTIVE INTERFACES [J].
BISI, O ;
CHIAO, LW ;
TU, KN .
PHYSICAL REVIEW B, 1984, 30 (08) :4664-4674
[7]   ELECTRONIC-STRUCTURE OF NISI2 [J].
CHANG, YJ ;
ERSKINE, JL .
PHYSICAL REVIEW B, 1982, 26 (12) :7031-7034
[8]   ATOMIC-STRUCTURE OF THE NISI2/(111)SI INTERFACE [J].
CHERNS, D ;
ANSTIS, GR ;
HUTCHISON, JL ;
SPENCE, JCH .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 46 (05) :849-862
[9]   LATTICE-LOCATION EXPERIMENT OF THE NI-SI INTERFACE BY THIN-CRYSTAL CHANNELING OF HELIUM-IONS [J].
CHEUNG, NW ;
MAYER, JW .
PHYSICAL REVIEW LETTERS, 1981, 46 (10) :671-674
[10]   NI ON SI(111) - REACTIVITY AND INTERFACE STRUCTURE [J].
CHEUNG, NW ;
CULBERTSON, RJ ;
FELDMAN, LC ;
SILVERMAN, PJ ;
WEST, KW ;
MAYER, JW .
PHYSICAL REVIEW LETTERS, 1980, 45 (02) :120-124