LATERALLY SEEDED REGROWTH OF SILICON OVER SIO2 THROUGH STRIP ELECTRON-BEAM IRRADIATION

被引:21
作者
HAYAFUJI, Y [1 ]
YANADA, T [1 ]
USUI, S [1 ]
KAWADO, S [1 ]
SHIBATA, A [1 ]
WATANABE, N [1 ]
KIKUCHI, M [1 ]
WILLIAMS, KE [1 ]
机构
[1] ENERGY SCI INC, WOBURN, MA 01801 USA
关键词
D O I
10.1063/1.94393
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:473 / 475
页数:3
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