LASER-INDUCED EPITAXIAL REGROWTH OF SI1-XGEX/SI LAYERS PRODUCED BY GE ION-IMPLANTATION

被引:9
作者
BERTI, M
MAZZI, G
DRIGO, AV
MIGLIORI, A
JANNITTI, E
NICOLETTI, S
机构
[1] DIPARTIMENTO SCI MAT,UNITA CISM,GNSM,I-73100 LECCE,ITALY
[2] CNR,LAMEL LAB,I-40126 BOLOGNA,ITALY
[3] AUR EL SPA,I-47015 FORLI,ITALY
[4] CNR,IST GAS IONIZZATI,I-35100 PADUA,ITALY
关键词
D O I
10.1016/0169-4332(89)90205-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:158 / 164
页数:7
相关论文
共 12 条
[1]   EPITAXIAL GEXSI1-X SI(100) STRUCTURES PRODUCED BY PULSED LASER MIXING OF EVAPORATED GE ON SI(100) SUBSTRATES [J].
ABELSON, JR ;
SIGMON, TW ;
KIM, KB ;
WEINER, KH .
APPLIED PHYSICS LETTERS, 1988, 52 (03) :230-232
[2]   EXPLOSIVE CRYSTALLIZATION OF DILUTE AMORPHOUS SI-GE ALLOYS [J].
AYDINLI, A ;
BERTI, M ;
DRIGO, AV ;
LOTTI, R ;
MERLI, PG .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (06) :3301-3303
[3]  
AYDINLI A, 1987, GROWTH CHARACTERIZAT, P193
[4]   INTERCOMPARISON OF ABSOLUTE STANDARDS FOR RBS STUDIES [J].
COHEN, C ;
DAVIES, JA ;
DRIGO, AV ;
JACKMAN, TE .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :147-148
[5]   A THERMAL DESCRIPTION OF THE MELTING OF C-SILICON AND A-SILICON UNDER PULSED EXCIMER LASERS [J].
DEUNAMUNO, S ;
FOGARASSY, E .
APPLIED SURFACE SCIENCE, 1989, 36 (1-4) :1-11
[6]   HETEROEPITAXY OF A DEPOSITED AMORPHOUS-GERMANIUM LAYER ON A SILICON SUBSTRATE BY LASER ANNEALING [J].
GOLECKI, I ;
KENNEDY, EF ;
LAU, SS ;
MAYER, JW ;
TSENG, WF ;
ECKARDT, RC ;
WAGNER, RJ .
THIN SOLID FILMS, 1979, 57 (01) :L13-L15
[7]   DOPANT REDISTRIBUTION BY PULSED-LASER ANNEALING OF ION-IMPLANTED SILICON [J].
HOONHOUT, D ;
SARIS, FW .
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1982, 66 (1-2) :43-59
[8]   TIME-RESOLVED REFLECTIVITY MEASUREMENTS ON SILICON AND GERMANIUM USING A PULSED EXCIMER KRF LASER-HEATING BEAM [J].
JELLISON, GE ;
LOWNDES, DH ;
MASHBURN, DN ;
WOOD, RF .
PHYSICAL REVIEW B, 1986, 34 (04) :2407-2415
[9]  
LAU SS, 1978, APPL PHYS LETT, V33, P235, DOI 10.1063/1.90310
[10]  
Lowndes D. H., 1987, Journal of Materials Research, V2, P648, DOI 10.1557/JMR.1987.0648