THE EFFECT OF CRYSTAL DEFECTS ON DEVICE PERFORMANCE AND RELIABILITY

被引:14
作者
CHIN, AK
机构
关键词
D O I
10.1016/0022-0248(84)90320-8
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
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页码:582 / 596
页数:15
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