MEASUREMENTS OF THE CF RADICAL IN DC PULSED CF4/H2 DISCHARGE PLASMA USING INFRARED DIODE-LASER ABSORPTION-SPECTROSCOPY

被引:59
作者
MAGANE, M [1 ]
ITABASHI, N [1 ]
NISHIWAKI, N [1 ]
GOTO, T [1 ]
YAMADA, C [1 ]
HIROTA, E [1 ]
机构
[1] INST MOLEC SCI,OKAZAKI,AICHI 444,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1990年 / 29卷 / 05期
关键词
CF radical density; CF/H2; plasma; Diffusion coefficient; Etching plasma; Infrared diode laser absorption spectroscopy;
D O I
10.1143/JJAP.29.L829
中图分类号
O59 [应用物理学];
学科分类号
摘要
Infrared diode laser absorption spectroscopy (IRLAS) was established as the measurement method for the CF radical density. The absolute density of the CF radical and its pressure dependences were measured in DC pulsed CF4/H2 discharge plasma. Moreover, from the analysis of the decay parts of the observed transient absorption waveforms of the CF radical, the CF radical was shown to be removed mainly by a diffusion process in the present plasma, yielding the diffusion coefficients D(CF in H2) and D(CF in CF4). © 1990 The Japan Society of Applied Physics.
引用
收藏
页码:L829 / L832
页数:4
相关论文
共 12 条
[1]   LASER-INDUCED FLUORESCENCE DETECTION OF CF AND CF2 RADICALS IN A CF4/O2 PLASMA [J].
BOOTH, JP ;
HANCOCK, G ;
PERRY, ND .
APPLIED PHYSICS LETTERS, 1987, 50 (06) :318-319
[2]  
BROWN SC, 1956, HDB PHYSIK, V22, P533
[3]   FORMATION OF A SILICON-CARBIDE LAYER DURING CF4/H2 DRY ETCHING OF SI [J].
COYLE, GJ ;
OEHRLEIN, GS .
APPLIED PHYSICS LETTERS, 1985, 47 (06) :604-606
[4]  
GORDY W, 1970, MICROWAVE MOL SPECTR, pCH3
[5]   MEASUREMENTS OF F-STAR, CF, AND CF2 FORMATION AND DECAY IN PULSED FLUOROCARBON DISCHARGES [J].
HANSEN, SG ;
LUCKMAN, G ;
COLSON, SD .
APPLIED PHYSICS LETTERS, 1988, 53 (17) :1588-1590
[6]   ABINITIO MRD CI POTENTIAL CURVES, DIPOLE-MOMENTS AND ZERO-FIELD SPLITTINGS FOR THE X2-PI GROUND-STATES OF THE CF AND CCL MOLECULES [J].
HESS, BA ;
BUENKER, RJ .
CHEMICAL PHYSICS, 1986, 101 (02) :211-218
[7]   SPATIAL-DISTRIBUTION OF SIH3 RADICALS IN RF SILANE PLASMA [J].
ITABASHI, N ;
NISHIWAKI, N ;
MAGANE, M ;
NAITO, S ;
GOTO, T ;
MATSUDA, A ;
YAMADA, C ;
HIROTA, E .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1990, 29 (03) :L505-L507
[8]   MEASUREMENT OF THE SIH3 RADICAL DENSITY IN SILANE PLASMA USING INFRARED DIODE-LASER ABSORPTION-SPECTROSCOPY [J].
ITABASHI, N ;
KATO, K ;
NISHIWAKI, N ;
GOTO, T ;
YAMADA, C ;
HIROTA, E .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1988, 27 (08) :L1565-L1567
[9]  
MCDANIEL EW, 1964, COLLISION PHENOMENA, P455
[10]   DIAGNOSTICS OF MICROWAVE PLASMA BY LASER-INDUCED FLUORESCENCE [J].
NINOMIYA, K ;
SUZUKI, K ;
NISHIMATSU, S ;
OKADA, O .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03) :1791-1794