SURFACE STATES FROM PHOTOEMISSION THRESHOLD MEASUREMENTS ON A CLEAN, CLEAVED, SI(111) SURFACE

被引：142

作者：

SEBENNE, C ^{[1
]}

BOLMONT, D ^{[1
]}

GUICHAR, G ^{[1
]}

BALKANSKI, M ^{[1
]}

机构：

[1] UNIV PARIS 06, CNRS, LAB PHYS SOLIDES, 4 PL JUSSIEU, 75005 PARIS, FRANCE

来源：

PHYSICAL REVIEW B | 1975年 / 12卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.12.3280

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3280 / 3285

页数：6

共 23 条

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