LOW-ENERGY ELECTRON LOSS SPECTROSCOPIC STUDY OF PD-SI(111) SYSTEM

被引：14

作者：

OKUNO, K

ITO, T

IWAMI, M

HIRAKI, A

机构：

来源：

SOLID STATE COMMUNICATIONS | 1982年 / 44卷 / 02期

关键词：

D O I：

10.1016/0038-1098(82)90432-X

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：209 / 212

页数：4

共 10 条

[1] ELS AND LEED STUDY OF CO ADSORPTION ON PD(001) AND PD(001) 6-DEGREES [110] [J].

BADER, SD ;

BLAKELY, JM ;

BRODSKY, MB ;

FRIDDLE, RJ ;

PANOSH, RL .

SURFACE SCIENCE, 1978, 74 (02) :405-422

[2] MICROSCOPIC COMPOUND FORMATION AT THE PD-SI(111) INTERFACE [J].

FREEOUF, JL ;

RUBLOFF, GW ;

HO, PS ;

KUAN, TS .

PHYSICAL REVIEW LETTERS, 1979, 43 (24) :1836-1839

[3] ROOM-TEMPERATURE INTERFACIAL REACTION IN AU-SEMICONDUCTOR SYSTEMS [J].

HIRAKI, A ;

SHUTO, K ;

KIM, S ;

KAMMURA, W ;

IWAMI, M .

APPLIED PHYSICS LETTERS, 1977, 31 (09) :611-612

[4] A NEW APPLICATION OF ELECTRON-ENERGY LOSS SPECTROSCOPY TECHNIQUE FOR A NONDESTRUCTIVE STUDY OF THE SI-SIO2 INTERFACE [J].

ITO, T ;

IWAMI, M ;

HIRAKI, A .

SOLID STATE COMMUNICATIONS, 1980, 36 (08) :695-699

[5] PRESENCE OF CRITICAL AU-FILM THICKNESS FOR ROOM-TEMPERATURE INTERFACIAL REACTION BETWEEN AU(FILM) AND SI(CRYSTAL SUBSTRATE) [J].

OKUNO, K ;

ITO, T ;

IWAMI, M ;

HIRAKI, A .

SOLID STATE COMMUNICATIONS, 1980, 34 (06) :493-497

[6] PARTIAL DENSITIES OF STATES IN AMORPHOUS PD0.81SI0.19 [J].

RILEY, JD ;

LEY, L ;

AZOULAY, J ;

TERAKURA, K .

PHYSICAL REVIEW B, 1979, 20 (02) :776-783

[7] ELECTRON-ENERGY LOSS SPECTROSCOPY OF SI(111)-SIMPLE-METAL INTERFACE [J].

ROWE, JE ;

MARGARITONDO, G ;

CHRISTMAN, SB .

PHYSICAL REVIEW B, 1977, 15 (04) :2195-2201

[8] ELECTRONIC STATES AND ATOMIC-STRUCTURE AT THE PD2SI-SI INTERFACE [J].

SCHMID, PE ;

HO, PS ;

FOLL, H ;

RUBLOFF, GW .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03) :937-943

[9]

TROMP R, THIN SOLID FILMS

[10]

TROMP RM, UNPUB SURF SCI

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