STUDY OF SEGREGATION INHOMOGENEITIES IN GAAS BY MEANS OF DSL PHOTOETCHING AND EBIC MEASUREMENTS

被引：28

作者：

FRIGERI, C ^{[1
]}

WEYHER, JL ^{[1
]}

ZANOTTI, L ^{[1
]}

机构：

[1] CATHOLIC UNIV NIJMEGEN,MAT RES INST,DEPT SOLID STATE 3,6525 ED NIJMEGEN,NETHERLANDS

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1989年 / 136卷 / 01期

关键词：

D O I：

10.1149/1.2096599

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：262 / 266

页数：5

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