POINT-DEFECT YIELD MODEL FOR WAFER SCALE INTEGRATION

[1] DAUGHTON JH, 1984, OCT P IEEE INT C COM, P88

[2] ELKIND SA, 1982, THEORY PRACTICE RELI

[3] GOUBAU WM, COMMUNICATION

[4] HU SM, 1984, ELECTRON DEVICES MAR, P4

[5] COST-SIZE OPTIMA OF MONOLITHIC INTEGRATED CIRCUITS [J]. PROCEEDINGS OF THE IEEE, 1964, 52 (12) : 1537 - &

[6] ANALYSIS ON YIELD OF INTEGRATED-CIRCUITS AND A NEW EXPRESSION FOR YIELD [J]. ELECTRICAL ENGINEERING IN JAPAN, 1972, 92 (06) : 135 - 141

[7] MODIFICATION OF POISSON STATISTICS - MODELING DEFECTS INDUCED BY DIFFUSION [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1977, 12 (05) : 540 - 546

[8] Raibert M. H., 1982, INT J ROBOTICS RES, V1, P3

[9] DEFECT DENSITY DISTRIBUTION FOR LSI YIELD CALCULATIONS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (07) : 655 - 657

[10] INTEGRATED-CIRCUIT YIELD STATISTICS [J]. PROCEEDINGS OF THE IEEE, 1983, 71 (04) : 453 - 470

[1] DAUGHTON JH, 1984, OCT P IEEE INT C COM, P88

[2] ELKIND SA, 1982, THEORY PRACTICE RELI

[3] GOUBAU WM, COMMUNICATION

[4] HU SM, 1984, ELECTRON DEVICES MAR, P4

[5] COST-SIZE OPTIMA OF MONOLITHIC INTEGRATED CIRCUITS [J]. PROCEEDINGS OF THE IEEE, 1964, 52 (12) : 1537 - &

[6] ANALYSIS ON YIELD OF INTEGRATED-CIRCUITS AND A NEW EXPRESSION FOR YIELD [J]. ELECTRICAL ENGINEERING IN JAPAN, 1972, 92 (06) : 135 - 141

[7] MODIFICATION OF POISSON STATISTICS - MODELING DEFECTS INDUCED BY DIFFUSION [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1977, 12 (05) : 540 - 546

[8] Raibert M. H., 1982, INT J ROBOTICS RES, V1, P3

[9] DEFECT DENSITY DISTRIBUTION FOR LSI YIELD CALCULATIONS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (07) : 655 - 657

[10] INTEGRATED-CIRCUIT YIELD STATISTICS [J]. PROCEEDINGS OF THE IEEE, 1983, 71 (04) : 453 - 470