A MECHANISM FOR RADIATION-INDUCED DEGRADATION IN GAAS FIELD-EFFECT TRANSISTORS

被引：8

作者：

BUOT, FA

ANDERSON, WT

CHRISTOU, A

CAMPBELL, AB

KNUDSON, AR

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1985年 / 57卷 / 02期

关键词：

D O I：

10.1063/1.334741

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：581 / 590

页数：10

共 37 条

[1]

ANDERSON D, WOCSEMMAD 84 SAN FRA

[2] REDUCTION OF LONG-TERM TRANSIENT RADIATION RESPONSE IN ION-IMPLANTED GAAS-FETS [J].

ANDERSON, WT ;

SIMONS, M ;

KING, EE ;

DIETRICH, HB ;

LAMBERT, RJ .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) :1533-1538

[3]

ANDERSON WT, UNPUB IEEE T NUCL SC

[4] PREMATURE FAILURE IN PT-GAAS IMPATTS - RECOMBINATION-ASSISTED DIFFUSION AS A FAILURE MECHANISM [J].

BALLAMY, WC ;

KIMERLING, LC .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (06) :746-752

[5] SOME NEW ASPECTS OF THERMAL INSTABILITY OF CURRENT DISTRIBUTION IN POWER TRANSISTORS [J].

BERGMANN, F ;

GERSTNER, D .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (8-9) :630-+

[6] ENHANCED DIFFUSION MECHANISMS [J].

BOURGOIN, JC ;

CORBETT, JW .

RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1978, 36 (3-4) :157-188

[7]

BUOT FA, 1983, SOLID STATE ELECTRON, V26, P617, DOI 10.1016/0038-1101(83)90016-3

[8]

BUOT FA, UNPUB SOLID STATE EL

[9]

CALDWELL RS, 1966, NOV NE EL RES ENG M, P28

[10] CHARGE COLLECTION IN TEST STRUCTURES [J].

CAMPBELL, AB ;

KNUDSON, AR ;

SHAPIRO, P ;

PATTERSON, DO ;

SEIBERLING, LE .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4486-4492

← 1 2 3 4 →