MICROLITHOGRAPHIC BEHAVIOR OF TRANSITION-METAL OXIDE RESISTS EXPOSED TO FOCUSED ION-BEAM

被引:11
作者
KOSHIDA, N [1 ]
ICHINOSE, Y [1 ]
OHTAKA, K [1 ]
KOMURO, M [1 ]
ATODA, N [1 ]
机构
[1] ELECTROTECH LAB,SAKURA,IBARAKI 305,JAPAN
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1990年 / 8卷 / 05期
关键词
D O I
10.1116/1.584922
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1093 / 1096
页数:4
相关论文
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