TRANSIENT CAPACITANCE SPECTROSCOPY OF NA+-INDUCED SURFACE-STATES AT THE SI/SIO2 INTERFACE

被引：24

作者：

ROSENCHER, E

COPPARD, R

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1984年 / 55卷 / 04期

关键词：

D O I：

10.1063/1.333152

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：971 / 979

页数：9

共 34 条

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