QUASI ONE-DIMENSIONAL CONDUCTION IN MULTIPLE, PARALLEL INVERSION LINES

被引：120

作者：

WARREN, AC ^{[1
]}

ANTONIADIS, DA ^{[1
]}

SMITH, HI ^{[1
]}

机构：

[1] MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139

来源：

PHYSICAL REVIEW LETTERS | 1986年 / 56卷 / 17期

关键词：

D O I：

10.1103/PhysRevLett.56.1858

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1858 / 1861

页数：4

共 11 条

[1] ELECTRONIC-PROPERTIES OF TWO-DIMENSIONAL SYSTEMS
ANDO, T
FOWLER, AB
STERN, F
[J]. REVIEWS OF MODERN PHYSICS, 1982, 54 (02) : 437 - 672
[2] CONDUCTANCE IN RESTRICTED-DIMENSIONALITY ACCUMULATION LAYERS
FOWLER, AB
HARTSTEIN, A
WEBB, RA
[J]. PHYSICAL REVIEW LETTERS, 1982, 48 (03) : 196 - 199
[3] ONE-DIMENSIONAL CONDUCTANCE IN SILICON MOSFETS
HARTSTEIN, A
WEBB, RA
FOWLER, AB
WAINER, JJ
[J]. SURFACE SCIENCE, 1984, 142 (1-3) : 1 - 13
[4] NONMONOTONIC VARIATIONS OF THE CONDUCTANCE WITH ELECTRON-DENSITY IN APPROXIMATELY 70-NM-WIDE INVERSION-LAYERS
KWASNICK, RF
KASTNER, MA
MELNGAILIS, J
LEE, PA
[J]. PHYSICAL REVIEW LETTERS, 1984, 52 (03) : 224 - 227
[5] MAGNETOCONDUCTANCE AND QUANTIZED CONFINEMENT IN NARROW SILICON INVERSION-LAYERS
SKOCPOL, WJ
JACKEL, LD
HOWARD, RE
CRAIGHEAD, HG
FETTER, LA
MANKIEWICH, PM
GRABBE, P
TENNANT, DM
[J]. SURFACE SCIENCE, 1984, 142 (1-3) : 14 - 18
[6] ONE-DIMENSIONAL LOCALIZATION AND INTERACTION EFFECTS IN NARROW (0.1-MU-M) SILICON INVERSION-LAYERS
SKOCPOL, WJ
JACKEL, LD
HU, EL
HOWARD, RE
FETTER, LA
[J]. PHYSICAL REVIEW LETTERS, 1982, 49 (13) : 951 - 955
[7] FABRICATION OF SUB-100-NM LINEWIDTH PERIODIC STRUCTURES FOR STUDY OF QUANTUM EFFECTS FROM INTERFERENCE AND CONFINEMENT IN SI INVERSION-LAYERS
WARREN, AC
PLOTNIK, I
ANDERSON, EH
SCHATTENBURG, ML
ANTONIADIS, DA
SMITH, HI
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (01): : 365 - 368
[8] SURFACE SUPERLATTICE FORMATION IN SILICON INVERSION-LAYERS USING 0.2-MU-M PERIOD GRATING-GATE ELECTRODES
WARREN, AC
ANTONIADIS, DA
SMITH, HI
MELNGAILIS, J
[J]. IEEE ELECTRON DEVICE LETTERS, 1985, 6 (06) : 294 - 296
[9] WARREN AC, 1985, THESIS MIT
[10] QUASI-ONE-DIMENSIONAL EFFECTS IN SUB-MICRON WIDTH SILICON INVERSION-LAYERS
WHEELER, RG
CHOI, KK
WISNIEFF, R
[J]. SURFACE SCIENCE, 1984, 142 (1-3) : 19 - 24

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