INFLUENCE OF OXYGEN ON THE FORMATION OF REFRACTORY-METAL SILICIDES

被引:33
作者
BOMCHIL, G
GOELTZ, G
TORRES, J
机构
[1] CNET, Meylan, Fr, CNET, Meylan, Fr
关键词
OXYGEN - REFRACTORY METALS - THERMODYNAMIC PROPERTIES;
D O I
10.1016/0040-6090(86)90159-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In very-large-scale integration, refractory metal silicides are generally obtained by codeposition but there is increased interest in self-aligned structures where the formation of the silicide occurs through a reaction between the deposited metal and silicon. The presence of impurities may affect the formation process and the properties of the silicide films. On the basis of thermodynamic and kinetic considerations it is possible to establish some essential features of the influence of oxygen as a function of the amount of oxygen and its location, the silicide considered and the procedure used to obtain it. Experimental evidence is presented to illustrate the behavior of oxygen in various systems. Methods to eliminate oxygen contamination or to overcome its detrimental effects are discussed.
引用
收藏
页码:59 / 70
页数:12
相关论文
共 38 条
[1]   INTERFACE-MARKER TECHNIQUE APPLIED TO THE STUDY OF METAL SILICIDE GROWTH [J].
BAGLIN, JEE ;
DHEURLE, FM ;
HAMMER, WN ;
PETERSSON, S .
NUCLEAR INSTRUMENTS & METHODS, 1980, 168 (1-3) :491-497
[2]   TITANIUM SILICIDE FORMATION - EFFECT OF OXYGEN DISTRIBUTION IN THE METAL-FILM [J].
BERTI, M ;
DRIGO, AV ;
COHEN, C ;
SIEJKA, J ;
BENTINI, GG ;
NIPOTI, R ;
GUERRI, S .
JOURNAL OF APPLIED PHYSICS, 1984, 55 (10) :3558-3565
[3]   EFFECTIVENESS OF SIO2 FOR PREVENTING SILICON METAL REACTIONS AT HIGH-TEMPERATURES [J].
BEVOLO, AJ ;
CAMPISI, GJ ;
SHANKS, HR ;
SCHMIDT, FA .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (10) :5390-5395
[4]   THERMODYNAMIC CONSIDERATIONS IN REFRACTORY METAL-SILICON-OXYGEN SYSTEMS [J].
BEYERS, R .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (01) :147-152
[5]   FORMATION KINETICS OF MOSI2 INDUCED BY CW SCANNED LASER-BEAM [J].
BOMCHIL, G ;
BENSAHEL, D ;
GOLANSKI, A ;
FERRIEU, F ;
AUVERT, G ;
PERIO, A ;
PFISTER, JC .
APPLIED PHYSICS LETTERS, 1982, 41 (01) :46-48
[6]  
BOMCHIL G, 1983, 164TH M EL SOC WASH
[7]   CHEMICAL BONDING AND REACTIONS AT TI/SI AND TI/OXYGEN/SI INTERFACES [J].
BUTZ, R ;
RUBLOFF, GW ;
HO, PS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02) :771-775
[8]   IDENTIFICATION OF DOMINANT DIFFUSING SPECIES IN SILICIDE FORMATION [J].
CHU, WK ;
KRAUTLE, H ;
MAYER, JW ;
MULLER, H ;
NICOLET, MA ;
TU, KN .
APPLIED PHYSICS LETTERS, 1974, 25 (08) :454-457
[9]   FORMATION AND CHARACTERIZATION OF TUNGSTEN SILICIDE LAYERS [J].
GOLTZ, G ;
TORRES, J ;
LAJZEROWICZ, J ;
BOMCHIL, G .
THIN SOLID FILMS, 1985, 124 (01) :19-26
[10]   GROWTH-KINETICS OF PLANAR BINARY DIFFUSION COUPLES - THIN-FILM CASE VERSUS BULK CASES [J].
GOSELE, U ;
TU, KN .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (04) :3252-3260