BULK AND SURFACE 1/F NOISE

被引：52

作者：

VANDAMME, LKJ

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1989年 / 36卷 / 05期

关键词：

D O I：

10.1109/16.299682

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：987 / 992

页数：6

共 21 条

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[17] CORRELATION BETWEEN MOST 1/F NOISE AND CCD TRANSFER INEFFICIENCY [J].

VANDAMME, LKJ ;

DEVRIES, RGMP .

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[19]

VANDAMME LKJ, 1988, ION IMPLANTATION SEM, V1, P153

[20]

VANDAMME LKJ, 1983, NOISE PHYSICAL SYSTE, P183

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