POROUS SILICON LAYERS AND ITS OXIDE FOR THE SILICON-ON-INSULATOR STRUCTURE

被引:9
作者
TAKAI, H [1 ]
ITOH, T [1 ]
机构
[1] WASEDA UNIV,SCH SCI & ENGN,SHINJUKU KU,TOKYO 160,JAPAN
关键词
D O I
10.1063/1.337686
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:222 / 225
页数:4
相关论文
共 10 条
[1]   FORMATION AND OXIDATION OF POROUS SILICON BY ANODIC REACTION [J].
ARITA, Y .
JOURNAL OF CRYSTAL GROWTH, 1978, 45 (01) :383-392
[2]   DIELECTRIC ISOLATION - COMPREHENSIVE, CURRENT AND FUTURE [J].
BEAN, KE ;
RUNYAN, WR .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (01) :C5-C12
[3]   A NEW DIELECTRIC ISOLATION METHOD USING POROUS SILICON [J].
IMAI, K .
SOLID-STATE ELECTRONICS, 1981, 24 (02) :159-&
[4]   CHARACTERISTICS OF SI FILMS GROWN ON ION PROCESSED SAPPHIRE SUBSTRATES BY PLASMA DISSOCIATION OF SILANE [J].
ITOH, T ;
TAKAI, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (04) :597-602
[5]   CMOS DEVICES FABRICATED ON BURIED SIO2 LAYERS FORMED BY OXYGEN IMPLANTATION INTO SILICON [J].
IZUMI, K ;
DOKEN, M ;
ARIYOSHI, H .
ELECTRONICS LETTERS, 1978, 14 (18) :593-594
[6]   ION CHANNELING STUDIES OF CRYSTALLINE PERFECTION OF EPITAXIAL LAYERS [J].
PICRAUX, ST .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (02) :587-593
[7]  
TAKAI H, 1982, J ELECTRON MATER, V12, P973
[8]   STRUCTURE OF POROUS SILICON LAYER AND HEAT-TREATMENT EFFECT [J].
UNAGAMI, T ;
SEKI, M .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (08) :1339-1344
[9]   OXIDATION OF POROUS SILICON AND PROPERTIES OF ITS OXIDE FILM [J].
UNAGAMI, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (02) :231-241
[10]   FORMATION AND PROPERTIES OF POROUS SILICON AND ITS APPLICATION [J].
WATANABE, Y ;
ARITA, Y ;
YOKOYAMA, T ;
IGARASHI, Y .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (10) :1351-1355