DIRECT OBSERVATION OF PRECIPITATES AND SELF-ORGANIZED NANOSTRUCTURES IN MOLECULAR-BEAM EPITAXY-GROWN HEAVILY-DOPED GAAS-SI

被引:4
作者
GWO, S [1 ]
MIWA, S [1 ]
OHNO, H [1 ]
FAN, JF [1 ]
TOKUMOTO, H [1 ]
机构
[1] JOINT RES CTR ATOM TECHNOL,NATL INST ADV INTERDISCIPLINARY RES,TSUKUBA,IBARAKI 305,JAPAN
关键词
D O I
10.1063/1.114854
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report a cross-sectional scanning tunneling microscopy investigation of heavily Si doped [001]-oriented GaAs grown by molecular-beam epitaxy. At a very high doping level (6 x 10(19) cm(-3)), Si-doping induced precipitates are directly observed in XSTM images of the as-grown epitaxial layers. Most of the precipitates are found to have a characteristic oval shape with the long axis (similar to 80 Angstrom) along the growth direction. In contrast to the low diffusivity of randomly distributed Si dopants in the moderate doping regime, these precipitates are found to be highly mobile and spontaneously form ''nanowires'' during crystal growth. (C) 1995 American Institute of Physics.
引用
收藏
页码:3123 / 3125
页数:3
相关论文
共 17 条
[11]   MECHANISM OF COMPENSATION IN HEAVILY SILICON-DOPED GALLIUM-ARSENIDE GROWN BY MOLECULAR-BEAM EPITAXY [J].
MAGUIRE, J ;
MURRAY, R ;
NEWMAN, RC ;
BEALL, RB ;
HARRIS, JJ .
APPLIED PHYSICS LETTERS, 1987, 50 (09) :516-518
[12]   DIRECT EVIDENCE OF CARBON PRECIPITATES IN GAAS AND INP [J].
MOLL, AJ ;
HALLER, EE ;
AGER, JW ;
WALUKIEWICZ, W .
APPLIED PHYSICS LETTERS, 1994, 65 (09) :1145-1147
[13]   HEAVILY SI-DOPED GAAS AND ALAS/N-GAAS SUPERLATTICE GROWN BY MOLECULAR-BEAM EPITAXY [J].
OGAWA, M ;
BABA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (08) :L572-L574
[14]   HIGHLY DOPED GAAS-SI BY MOLECULAR-BEAM EPITAXY [J].
SACKS, R ;
SHEN, H .
APPLIED PHYSICS LETTERS, 1985, 47 (04) :374-376
[15]   DIFFUSION OF ATOMIC SILICON IN GALLIUM-ARSENIDE [J].
SCHUBERT, EF ;
STARK, JB ;
CHIU, TH ;
TELL, B .
APPLIED PHYSICS LETTERS, 1988, 53 (04) :293-295
[16]   LOW-TEMPERATURE GROWTH OF HIGHLY DOPED GAAS-SI BY ATOMIC LAYER MOLECULAR-BEAM EPITAXY [J].
SILVEIRA, JP ;
BRIONES, F .
APPLIED PHYSICS LETTERS, 1994, 65 (05) :573-574
[17]  
ZHENG JF, 1994, PHYS REV LETT, V772, P1490