HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF (CA,SR)F2/GAAS GROWN BY MOLECULAR-BEAM EPITAXY

被引:15
作者
HERAL, H [1 ]
BERNARD, L [1 ]
ROCHER, A [1 ]
FONTAINE, C [1 ]
MUNOZYAGUE, A [1 ]
机构
[1] LAB AUTOMAT ANAL SYST,F-31400 TOULOUSE,FRANCE
关键词
D O I
10.1063/1.337961
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:2410 / 2412
页数:3
相关论文
共 9 条
[1]   ELECTRON-MICROSCOPY OF EPITAXIAL SI/CAF2/SI STRUCTURES [J].
FATHAUER, RW ;
LEWIS, N ;
SCHOWALTER, LJ ;
HALL, EL .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (02) :736-738
[2]   SURFACE-MORPHOLOGY OF EPITAXIAL CAF2 FILMS ON SI SUBSTRATES [J].
FATHAUER, RW ;
SCHOWALTER, LJ .
APPLIED PHYSICS LETTERS, 1984, 45 (05) :519-521
[3]   AUGER-ELECTRON SPECTROSCOPY STUDY OF THE EPITAXIAL-GROWTH MODE OF (CA, SR)F2 ON GAAS(100) [J].
FONTAINE, C ;
CASTANO, JL ;
CASTAGNE, J ;
MUNOZYAGUE, A .
SURFACE SCIENCE, 1986, 168 (1-3) :681-687
[4]  
FONTAINE C, UNPUB
[5]  
Gibson J. M., 1983, MATER RES SOC S P, V14, P395
[6]   STRAIN-MEASUREMENT OF EPITAXIAL CAF2 ON SI(111) BY MEV ION CHANNELING [J].
HASHIMOTO, S ;
PENG, JL ;
GIBSON, WM ;
SCHOWALTER, LJ ;
FATHAUER, RW .
APPLIED PHYSICS LETTERS, 1985, 47 (10) :1071-1073
[7]   MOLECULAR-BEAM EPITAXY OF INSULATING FLUORIDE SEMICONDUCTOR HETEROSTRUCTURES [J].
MUNOZYAGUE, A ;
FONTAINE, C .
SURFACE SCIENCE, 1986, 168 (1-3) :626-634
[8]  
PHILLIPS JM, 1984, MATER RES SOC S P, V25, P381
[9]   EPITAXIAL RELATIONS IN CAXSR1-XF2 FILMS GROWN ON GAAS (111) AND GE(111) SUBSTRATES [J].
TSUTSUI, K ;
ISHIWARA, H ;
ASANO, T ;
FURUKAWA, S .
APPLIED PHYSICS LETTERS, 1985, 46 (12) :1131-1133