CRRES MICROELECTRONICS TEST PACKAGE (MEP)

被引：8

作者：

MULLEN, EG

RAY, KP

机构：

[1] PL/GPSP, Hanscom Air Force Base, Hanscom, MA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1993年 / 40卷 / 02期

关键词：

D O I：

10.1109/23.212346

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The Microelectronics Test Package (MEP) flown on board the Combined Release and Radiation Effects Satellite (CRRES) contained over 60 device types and approximately 400 total devices which were tested for both single event upset (SEU) and total dose (parametric degradation and annealing). A description of the experiment, the method of testing devices, and the structure of data acquisition are presented. Sample flight data are shown. These included SEUs from a GaAs 1 K RAM during the March 1991 solar flare, and a comparison between passive shielding and a specially designed spot shielding package.

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页码：228 / 232

页数：5

相关论文

共 14 条

[1] DEVELOPMENT OF AN MOS DOSIMETRY UNIT FOR USE IN SPACE [J].

ADAMS, L ;

HOLMESSIEDLE, A .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1978, 25 (06) :1607-1612

[2] PREDICTION OF ERROR RATES IN DOSE-IMPRINTED MEMORIES ON BOARD CRRES BY 2 DIFFERENT METHODS [J].

BRUCKER, GJ ;

STASSINOPOULOS, EG .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1991, 38 (03) :913-922

[3] SINGLE EVENT UPSET RATES IN SPACE [J].

CAMPBELL, A ;

MCDONALD, P ;

RAY, K .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1992, 39 (06) :1828-1835

[4] SEU FLIGHT DATA FROM THE CRRES MEP [J].

CAMPBELL, AB .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1991, 38 (06) :1647-1654

[5]

FREDERICKSON AR, 1989, IEEE T NUCL SCI, V36, P2405

[6] CRRES MICROELECTRONIC TEST CHIP [J].

LIN, YS ;

BUEHLER, MG ;

RAY, KP ;

SOKOLOSKI, MM .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1991, 38 (06) :1678-1685

[7]

MCDONALD P, 1992, UNPUB IEEE T NUCLEAR

[8] TEST OF SEU ALGORITHMS AGAINST PRELIMINARY CRRES SATELLITE DATA [J].

MCNULTY, PJ ;

BEAUVAIS, WJ ;

ABDELKADER, WG ;

ELTELEATY, SS ;

MULLEN, EG ;

RAY, KP .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1991, 38 (06) :1642-1646

[9] A DOUBLE-PEAKED INNER RADIATION BELT - CAUSE AND EFFECT AS SEEN ON CRRES [J].

MULLEN, EG ;

GUSSENHOVEN, MS ;

RAY, K ;

VIOLET, M .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1991, 38 (06) :1713-1717

[10] COMPARISON OF SEU RATE PREDICTION TECHNIQUES [J].

PETERSEN, EL ;

ADAMS, JH .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1992, 39 (06) :1836-1839