INTERFACE ANALYSIS BY SPECTROSCOPIC ELLIPSOMETRY OF GA1-XALXAS-GAAS HETEROJUNCTIONS GROWN BY METAL ORGANIC VAPOR-PHASE EPITAXY

被引：13

作者：

ERMAN, M

FRIJLINK, PM

机构：

来源：

APPLIED PHYSICS LETTERS | 1983年 / 43卷 / 03期

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D O I：

10.1063/1.94328

中图分类号：

O59 [应用物理学];

学科分类号：

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页码：285 / 287

页数：3

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