MODELS FOR TOTAL DOSE DEGRADATION OF LINEAR INTEGRATED-CIRCUITS

被引：37

作者：

JOHNSTON, AH

PLAAG, RE

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1987年 / 34卷 / 06期

关键词：

D O I：

10.1109/TNS.1987.4337502

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1474 / 1480

页数：7

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