ELECTRON DETECTION EXAFS IN HE AND VACUUM

被引：9

作者：

ELAM, WT

KIRKLAND, JP

NEISER, RA

WOLF, PD

机构：

[1] SACHS FREEMAN ASSOCIATES INC,LANDOVER,MD 20785

[2] PHILLIPS ELECTR INSTRUMENTS,MAHWAH,NJ 07430

来源：

PHYSICA B | 1989年 / 158卷 / 1-3期

关键词：

D O I：

10.1016/0921-4526(89)90290-1

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：295 / 298

页数：4

共 9 条

[1] DEPTH DEPENDENCE FOR EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE SPECTROSCOPY DETECTED VIA ELECTRON YIELD IN HE AND IN VACUUM [J].

ELAM, WT ;

KIRKLAND, JP ;

NEISER, RA ;

WOLF, PD .

PHYSICAL REVIEW B, 1988, 38 (01) :26-30

[2] TOTAL-ELECTRON-YIELD CURRENT MEASUREMENTS FOR NEAR-SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE [J].

ERBIL, A ;

CARGILL, GS ;

FRAHM, R ;

BOEHME, RF .

PHYSICAL REVIEW B, 1988, 37 (05) :2450-2464

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GUO, T ;

DENBOER, ML .

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[4] ELECTRON-YIELD EXTENDED X-RAY ABSORPTION FINE-STRUCTURE WITH THE USE OF A GAS-FLOW ELECTRON DETECTOR [J].

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HOFFMAN, RW .

PHYSICAL REVIEW B, 1984, 29 (01) :491-492

[5]

PIANETTA P, 1985, XRAY DATA BOOKLET, P3

[6] HIGH PASS PHOTO-CATHODE X-RAY IONIZATION-CHAMBER FOR SURFACE EXAFS [J].

SHEVCHIK, NJ ;

FISCHER, DA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1979, 50 (05) :577-581

[7] THEORY OF KLL AUGER ENERGIES INCLUDING STATIC RELAXATION [J].

SHIRLEY, DA .

PHYSICAL REVIEW A, 1973, 7 (05) :1520-1528

[8] RELAXATION EFFECTS ON AUGER ENERGIES [J].

SHIRLEY, DA .

CHEMICAL PHYSICS LETTERS, 1972, 17 (03) :312-315

[9]

TYLISZCZAK T, 1989, PHYSICA B, V158

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