MASS ANALYZED SECONDARY ION MICROSCOPY

被引：16

作者：

BERNIUS, MT ^{[1
]}

MORRISON, GH ^{[1
]}

机构：

[1] CORNELL UNIV,BAKER LAB,ITHACA,NY 14853

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1987年 / 58卷 / 10期

关键词：

D O I：

10.1063/1.1139523

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1789 / 1804

页数：16

共 79 条

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[2]

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[8] DARK-FIELD STIGMATIC ION MICROSCOPY FOR STRUCTURAL CONTRAST ENHANCEMENT [J].

BERNIUS, MT ;

LING, YC ;

MORRISON, GH .

JOURNAL OF APPLIED PHYSICS, 1986, 59 (10) :3332-3338

[9] EVALUATION OF ION MICROSCOPIC SPATIAL-RESOLUTION AND IMAGE QUALITY [J].

BERNIUS, MT ;

LING, YC ;

MORRISON, GH .

ANALYTICAL CHEMISTRY, 1986, 58 (01) :94-101

[10] ELIMINATION OF RESIDUAL IMAGE DISTORTION IN THE STIGMATIC ION-MICROSCOPE [J].

BERNIUS, MT ;

LING, YC ;

MORRISON, GH .

JOURNAL OF APPLIED PHYSICS, 1987, 61 (05) :1677-1681

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