CBE SELECTIVE EMBEDDED GROWTH FOR QUASI-PLANAR GAAS HBT APPLICATION

被引:9
作者
ALEXANDRE, F
ZERGUINE, D
LAUNAY, P
BENCHIMOL, JL
ETRILLARD, J
机构
[1] France Telecom, Centre National d'Etudes des Télécommunications, Laboratoire de Bagneux, F-92225 Bagneux Cedex
关键词
D O I
10.1016/0022-0248(93)90609-Z
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
This paper describes a new HBT epitaxial process using CBE selective embedded growth of GaAs and related materials, in order to obtain quasi-planar self-aligned HBTs. A perfect growth selectivity is first defined above a critical substrate temperature of 640 and 550-degrees-C, respectively, for GaAs and In containing compounds such as Ga1-xInxAs and Ga0.51In0.49P. Selective embedded GaAs growth is found to fill quite well a hole of a few mum2 area and 1 mum depth without overgrowth. Finally, the surface preparation prior to the regrowth is optimized in order to ensure a low contact resistivity for an n+ regrown HBT collector contact and a functional device.
引用
收藏
页码:221 / 225
页数:5
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