FORMATION OF ULTRASHALLOW P+-N JUNCTIONS BY LOW-ENERGY BORON IMPLANTATION USING A MODIFIED ION IMPLANTER

被引:25
作者
HONG, SN
RUGGLES, GA
PAULOS, JJ
WORTMAN, JJ
OZTURK, MC
机构
关键词
D O I
10.1063/1.100470
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1741 / 1743
页数:3
相关论文
共 11 条
[1]   GENERALIZED SCALING THEORY AND ITS APPLICATION TO A 1/4 MICROMETER MOSFET DESIGN [J].
BACCARANI, G ;
WORDEMAN, MR ;
DENNARD, RH .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (04) :452-462
[2]  
Burenkov A.F., 1986, TABLES ION IMPLANTAT
[3]   FABRICATION OF SUBMICROMETER MOSFETS USING GAS IMMERSION LASER DOPING (GILD) [J].
CAREY, PG ;
BEZJIAN, K ;
SIGMON, TW ;
GILDEA, P ;
MAGEE, TJ .
IEEE ELECTRON DEVICE LETTERS, 1986, 7 (07) :440-442
[4]  
DAHL DA, 1986, SIMION PC AT USERS M
[5]   1-2-KEV BORON IMPLANTS INTO SILICON [J].
DAVIES, DE .
IEEE ELECTRON DEVICE LETTERS, 1985, 6 (08) :397-399
[6]  
GARDEN B, 1986, J ELECTROCHEM SOC, V133, P2152
[7]   SOLID-II - HIGH-VOLTAGE HIGH-GAIN KILO-ANGSTROM-CHANNEL-LENGTH CMOSFETS USING SILICIDE WITH SELF-ALIGNED ULTRASHALLOW (3S) JUNCTION [J].
HORIUCHI, M ;
YAMAGUCHI, K .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (02) :260-269
[8]  
KIM KT, 1987, IEEE ELECTR DEVICE L, V8, P569
[9]   VERY-SHALLOW LOW-RESISTIVITY P+-N JUNCTIONS FOR CMOS TECHNOLOGY [J].
LING, E ;
MAGUIRE, PD ;
GAMBLE, HS ;
ARMSTRONG, BM .
IEEE ELECTRON DEVICE LETTERS, 1987, 8 (03) :96-97
[10]   VERY SHALLOW P+-N JUNCTION FORMATION BY LOW-ENERGY BF2+ ION-IMPLANTATION INTO CRYSTALLINE AND GERMANIUM PREAMORPHIZED SILICON [J].
OZTURK, MC ;
WORTMAN, JJ ;
FAIR, RB .
APPLIED PHYSICS LETTERS, 1988, 52 (12) :963-965